| 2015 | Impact of parameter variations on FinFET faults. | Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian |
| 2015 | Pulse shrinkage based pre-bond through silicon vias test in 3D IC. | Chang Hao, Huaguo Liang |
| 2015 | Testing cross wire opens within complex gates. | Chao Han, Adit D. Singh |
| 2015 | An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging. | Andres F. Gomez, Leticia B. Poehls, Fabian Vargas, Vctor H. Champac |
| 2015 | Abstraction-based relation mining for functional test generation. | Kelson Gent, Michael S. Hsiao |
| 2015 | Horizontal-FPN fault coverage improvement in production test of CMOS imagers. | Richun Fei, Jocelyn Moreau, Salvador Mir, Alexis Marcellin, C. Mandier, E. Huss, G. Palmigiani, P. Vitrou, Thomas Droniou |
| 2015 | Multi-cycle Circuit Parameter Independent ATPG for interconnect open defects. | Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker |
| 2015 | Capacitive Coupling Mitigation for TSV-based 3D ICs. | Ashkan Eghbal, Pooria M. Yaghini, Nader Bagherzadeh |
| 2015 | A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard. | Jennifer Dworak, Al Crouch |
| 2015 | 3D microelectronic with BEOL compatible devices. | Dominique Drouin, Mohamed Amine-Bounouar, Gabriel Droulers, M. Labalette, Michel Pioro-Ladriere, A. Souifi, Serge Ecoffey |
| 2015 | Field, experimental, and analytical data on large-scale HPC systems and evaluation of the implications for exascale system design. | Nathan DeBardeleben, Sean Blanchard, David R. Kaeli, Paolo Rech |
| 2015 | Automated testing of mixed-signal integrated circuits by topology modification. | Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2015 | Fault modeling and testing of 1T1R memristor memories. | Yong-Xiao Chen, Jin-Fu Li |
| 2015 | Statistical techniques for predicting system-level failure using stress-test data. | Harry H. Chen, Shih-Hua Kuo, Jonathan Tung, Mango Chia-Tso Chao |
| 2015 | PPB: Partially-working processors binning for maximizing wafer utilization. | Da Cheng, Sandeep K. Gupta |
| 2015 | Ultrafast stimulus error removal algorithm for ADC linearity test. | Tao Chen, Degang Chen |
| 2015 | Enabling unauthorized RF transmission below noise floor with no detectable impact on primary communication performance. | Doohwang Chang, Bertan Bakkaloglu, Sule Ozev |
| 2015 | Panel: When will the cost of dependability end innovation in computer design? | Valeria Bertacco |
| 2015 | Disturbance-free BIST for loop characterization of DC-DC buck converters. | Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Philippe Adell, Bert Vermeire, Bertan Bakkaloglu, Sule Ozev |
| 2015 | Special session: Hot topics: Statistical test methods. | Manuel J. Barragn, Gildas Lger, Florence Azas, Ronald D. Blanton, Adit D. Singh, Stephen Sunter |
| 2015 | Innovative practices session 5C: Advancements in test -keeping moore moving! | M. Enamul Amyeen |
| 2015 | TMO: A new class of attack on cipher misusing test infrastructure. | Sk Subidh Ali, Ozgur Sinanoglu |
| 2015 | Resiliency challenges in sub-10nm technologies. | Rob Aitken, Ethan H. Cannon, Mondira Pant, Mehdi Baradaran Tahoori |
| 2015 | Panel: Is design-for-security the new DFT? | Rob Aitken |
| 2015 | Yield prognosis for fab-to-fab product migration. | Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris |