IEEE VLSI Test Symposium
VTS
National
CORE rank
CORE rank (raw)
National/Regional
Fields of research
Computer Systems Engineering
Papers indexed
2,208
1991–2026
Papers per year
199189 peak2026
Most published authors
VTS papers
2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2023 | Test Generation for Defect-Based Faults of Scan Flip-Flops. | Yu-Teng Nien, Chen-Hong Li, Pei-Yin Wu, Yung-Jheng Wang, Kai-Chiang Wu, Mango C.-T. Chao |
| 2023 | Thwarting Reverse Engineering Attacks through Keyless Logic Obfuscation. | Leon Li, Alex Orailoglu |
| 2023 | Outlier Detection for Analog Tests Using Deep Learning Techniques. | Chin-Kuan Lin, Cheng-Che Lu, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao |
| 2023 | Design for testability (DFT) for RSFQ circuits. | Mingye Li, Yunkun Lin, Sandeep Gupta |
| 2023 | Diagnosis of Quantum Circuits in the NISQ Era. | Yu-Min Li, Cheng-Yun Hsieh, Yen-Wei Li, James Chien-Mo Li |
| 2023 | Allocating Physically Aware Embedded Memory Test & Repair Processor using Floorplan Info at the RTL Design Level. | Vinay Kumar, Bhrugurajsinh Chudasama, Bin B. W. Wang, Manish Arora, Bharath Shankaranarayanan |
| 2023 | Architectural Radiation Hardening of CMOS Power Management Circuits through Bias Tuning. | Gauri Koli, Liam Nguyen, Jennifer Kitchen |
| 2023 | Kernel Smoothing Technique Based on Multiple-Coordinate System for Screening Potential Failures in NAND Flash Memory. | Gooyoung Kim, Youngseon Moon, Jongmin Kim, Jaeyong Jeong, Eun-Kyoung Kim, Sunghoi Hur |
| 2023 | Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICs | Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
| 2023 | Gerabaldi: A Temporal Simulator for Probabilistic IC Degradation and Failure Processes. | Ian Hill, Andr Ivanov |
| 2023 | A Low Overhead Checksum Technique for Error Correction in Memristive Crossbar for Deep Learning Applications. | Surendra Hemaram, Soyed Tuhin Ahmed, Mahta Mayahinia, Christopher Mnch, Mehdi B. Tahoori |
| 2023 | Fully Deterministic Storage Based Logic Built-In Self-Test. | Subashini Gopalsamy, Irith Pomeranz |
| 2023 | Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. | Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2023 | An Exploration of ATPG Methods for Redacted IP and Reconfigurable Hardware. | Jackson Fugate, Greg Stitt, Naren Vikram Raj Masna, Aritra Dasgupta, Swarup Bhunia, Nij Dorairaj, David Kehlet |
| 2023 | Effective and Efficient Testing of Large Numbers of Inter-Die Interconnects in Chiplet-Based Multi-Die Packages. | Po-Yao Chuang, Francesco Lorenzelli, Sreejit Chakravarty, Cheng-Wen Wu, Georges G. E. Gielen, Erik Jan Marinissen |
| 2023 | Vmin Prediction Using Nondestructive Stress Test. | Chun Chen, Jeng-Yu Liao, James Chien-Mo Li, Harry H. Chen, Eric Jia-Wei Fang |
| 2023 | Functional Test Generation for AI Accelerators using Bayesian Optimization | Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Krishnendu Chakrabarty |
| 2023 | Hybrid Binary Neural Networks: A Tutorial Review. | Ahmet Enis etin, Hongyi Pan |
| 2023 | Special Session: Security Verification & Testing for SR-Latch TRNGs. | Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi |
| 2023 | Auxiliary State Machine Controlled Autonomous Design Verification Framework. | Gurumurti Kailaschandra Avhad, Shitin Sahu, Navaneeth Kumar |
| 2023 | A guided debugger-based fault injection methodology for assessing functional test programs. | Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre |
| 2023 | Pre and post silicon server platform transient performance using trans-inductor voltage regulator. | Judy Amanor-Badu, Ritchie Rice, Azizi Shuma, Rishik Bazaz, Horthense Tamdem |
| 2023 | Graph Neural Networks for Hardware Vulnerability Analysis - Can you Trust your GNN? | Lilas Alrahis, Ozgur Sinanoglu |
| 2023 | Special Session: Approximation and Fault Resiliency of DNN Accelerators. | Mohammad Hasan Ahmadilivani, Mario Barbareschi, Salvatore Barone, Alberto Bosio, Masoud Daneshtalab, Salvatore Della Torca, Gabriele Gavarini, Maksim Jenihhin, Jaan Raik, Annachiara Ruospo, Ernesto Snchez, Mahdi Taheri |
| 2023 | Special Session: CAD for Hardware Security - Promising Directions for Automation of Security Assurance. | Sohrab Aftabjahani, Mark Tehranipoor, Farimah Farahmandi, Bulbul Ahmed, Ryan Kastner, Francesco Restuccia, Andres Meza, Kaki Ryan, Nicole Fern, Jasper Van Woudenberg, Rajesh Velegalati, Cees-Bart Breunesse, Cynthia Sturton, Calvin Deutschbein |
226–250 of 2,208← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- AITCIEEE International Test Conference
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design