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IEEE VLSI Test Symposium

VTS

National

CORE rank

CORE rank (raw)

National/Regional

Fields of research

Computer Systems Engineering

Papers indexed

2,208

1991–2026

Papers per year

199189 peak2026

VTS papers

2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2023Test Generation for Defect-Based Faults of Scan Flip-Flops.Yu-Teng Nien, Chen-Hong Li, Pei-Yin Wu, Yung-Jheng Wang, Kai-Chiang Wu, Mango C.-T. Chao
2023Thwarting Reverse Engineering Attacks through Keyless Logic Obfuscation.Leon Li, Alex Orailoglu
2023Outlier Detection for Analog Tests Using Deep Learning Techniques.Chin-Kuan Lin, Cheng-Che Lu, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao
2023Design for testability (DFT) for RSFQ circuits.Mingye Li, Yunkun Lin, Sandeep Gupta
2023Diagnosis of Quantum Circuits in the NISQ Era.Yu-Min Li, Cheng-Yun Hsieh, Yen-Wei Li, James Chien-Mo Li
2023Allocating Physically Aware Embedded Memory Test & Repair Processor using Floorplan Info at the RTL Design Level.Vinay Kumar, Bhrugurajsinh Chudasama, Bin B. W. Wang, Manish Arora, Bharath Shankaranarayanan
2023Architectural Radiation Hardening of CMOS Power Management Circuits through Bias Tuning.Gauri Koli, Liam Nguyen, Jennifer Kitchen
2023Kernel Smoothing Technique Based on Multiple-Coordinate System for Screening Potential Failures in NAND Flash Memory.Gooyoung Kim, Youngseon Moon, Jongmin Kim, Jaeyong Jeong, Eun-Kyoung Kim, Sunghoi Hur
2023Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICsShao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty
2023Gerabaldi: A Temporal Simulator for Probabilistic IC Degradation and Failure Processes.Ian Hill, Andr Ivanov
2023A Low Overhead Checksum Technique for Error Correction in Memristive Crossbar for Deep Learning Applications.Surendra Hemaram, Soyed Tuhin Ahmed, Mahta Mayahinia, Christopher Mnch, Mehdi B. Tahoori
2023Fully Deterministic Storage Based Logic Built-In Self-Test.Subashini Gopalsamy, Irith Pomeranz
2023Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era.Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
2023An Exploration of ATPG Methods for Redacted IP and Reconfigurable Hardware.Jackson Fugate, Greg Stitt, Naren Vikram Raj Masna, Aritra Dasgupta, Swarup Bhunia, Nij Dorairaj, David Kehlet
2023Effective and Efficient Testing of Large Numbers of Inter-Die Interconnects in Chiplet-Based Multi-Die Packages.Po-Yao Chuang, Francesco Lorenzelli, Sreejit Chakravarty, Cheng-Wen Wu, Georges G. E. Gielen, Erik Jan Marinissen
2023Vmin Prediction Using Nondestructive Stress Test.Chun Chen, Jeng-Yu Liao, James Chien-Mo Li, Harry H. Chen, Eric Jia-Wei Fang
2023Functional Test Generation for AI Accelerators using Bayesian OptimizationArjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Krishnendu Chakrabarty
2023Hybrid Binary Neural Networks: A Tutorial Review.Ahmet Enis etin, Hongyi Pan
2023Special Session: Security Verification & Testing for SR-Latch TRNGs.Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2023Auxiliary State Machine Controlled Autonomous Design Verification Framework.Gurumurti Kailaschandra Avhad, Shitin Sahu, Navaneeth Kumar
2023A guided debugger-based fault injection methodology for assessing functional test programs.Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023Pre and post silicon server platform transient performance using trans-inductor voltage regulator.Judy Amanor-Badu, Ritchie Rice, Azizi Shuma, Rishik Bazaz, Horthense Tamdem
2023Graph Neural Networks for Hardware Vulnerability Analysis - Can you Trust your GNN?Lilas Alrahis, Ozgur Sinanoglu
2023Special Session: Approximation and Fault Resiliency of DNN Accelerators.Mohammad Hasan Ahmadilivani, Mario Barbareschi, Salvatore Barone, Alberto Bosio, Masoud Daneshtalab, Salvatore Della Torca, Gabriele Gavarini, Maksim Jenihhin, Jaan Raik, Annachiara Ruospo, Ernesto Snchez, Mahdi Taheri
2023Special Session: CAD for Hardware Security - Promising Directions for Automation of Security Assurance.Sohrab Aftabjahani, Mark Tehranipoor, Farimah Farahmandi, Bulbul Ahmed, Ryan Kastner, Francesco Restuccia, Andres Meza, Kaki Ryan, Nicole Fern, Jasper Van Woudenberg, Rajesh Velegalati, Cees-Bart Breunesse, Cynthia Sturton, Calvin Deutschbein
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