| 2014 | A method for phase noise extraction from data communication. | Allan Ecker, Mani Soma |
| 2014 | Special session 4A: Elevator talks. | Jennifer Dworak |
| 2014 | Innovative practices session 1C: Existing/emerging low power techniques. | Charutosh Dixit, Ramesh C. Tekumalla, Wei Zhao, Nilanjan Mukherjee, Vivek Chickermane |
| 2014 | Atomic model learning: A machine learning paradigm for post silicon debug of RF/analog circuits. | Sabyasachi Deyati, Barry John Muldrey, Aritra Banerjee, Abhijit Chatterjee |
| 2014 | Structural Software-Based Self-Test of Network-on-Chip. | Atefe Dalirsani, Michael E. Imhof, Hans-Joachim Wunderlich |
| 2014 | Hot topic session 12A: Split manufacturing - IARPA's TIC program. | Dean Collins, Ramesh Karri |
| 2014 | Hot topic session 12B: Stay relevant with standards-based DFT. | C. J. Clark, Vctor H. Champac |
| 2014 | Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests. | Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor |
| 2014 | Reliability enhancement using in-field monitoring and recovery for RF circuits. | Doohwang Chang, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Engin Afacan, Gnhan Dndar |
| 2014 | Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. | Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor |
| 2014 | Special session 11B: ITRS adaptive test update. | John M. Carulli |
| 2014 | A shared memory based parallel diagnosis system. | Xiaolei Cai, Emil Gizdarski, Dan Landau |
| 2014 | Innovative practices session 5C: Machine learning and data analysis in test. | Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee |
| 2014 | Active defense against counterfeiting attacks through robust antifuse-based on-chip locks. | Abhishek Basak, Yu Zheng, Swarup Bhunia |
| 2014 | Self-heating thermal-aware testing of FPGAs. | Abdulazim Amouri, Jochen Hepp, Mehdi Baradaran Tahoori |
| 2014 | Test-time optimization in NOC-based manycore SOCs using multicast routing. | Mukesh Agrawal, Krishnendu Chakrabarty |
| 2014 | Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? | Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda |
| 2013 | A built-in scheme for testing and repairing voltage regulators of low-power srams. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2013 | A study on the effectiveness of Trojan detection techniques using a red team blue team approach. | Xuehui Zhang, Kan Xiao, Mohammad Tehranipoor, Jeyavijayan Rajendran, Ramesh Karri |
| 2013 | Power supply noise control in pseudo functional test. | Tengteng Zhang, Duncan M. Hank Walker |
| 2013 | A hybrid ECC and redundancy technique for reducing refresh power of DRAMs. | Yun-Chao You, Chih-Sheng Hou, Li-Jung Chang, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu |
| 2013 | Path selection based on static timing analysis considering input necessary assignments. | Bo Yao, Arani Sinha, Irith Pomeranz |
| 2013 | Special session 12B: Panel post-silicon validation & test in huge variance era. | Takahiro J. Yamaguchi, Jacob A. Abraham, Gordon W. Roberts, Suriyaprakash Natarajan, Dennis J. Ciplickas |
| 2013 | Improving test generation by use of majority gates. | Peter Wohl, John A. Waicukauski |
| 2013 | Finding best voltage and frequency to shorten power-constrained test time. | Praveen Venkataramani, Suraj Sindia, Vishwani D. Agrawal |