| 2014 | Hot topic session 9C: Test and fault tolerance for emerging memory technologies. | Suriya Natarajan, Amitava Majumdar, Jeyavijayan Rajendran |
| 2014 | Built-in self-test for manufacturing TSV defects before bonding. | Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Hakim Zimouche |
| 2014 | Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms. | Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee |
| 2014 | Fast evaluation of test vector sets using a simulation-based statistical metric. | Shahrzad Mirkhani, Jacob A. Abraham |
| 2014 | TSV aware timing analysis and diagnosis in paths with multiple TSVs. | Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel |
| 2014 | Continuous wave radar circuitry testing using OFDM technique. | Mohamed Metwally, Nicholai L'Esperance, Tian Xia, Mustapha Slamani |
| 2014 | Innovative practices session 4C: Disruptive solutions in the non-digital world. | Amitava Majumdar, Suriya Natarajan, Stephen K. Sunter, Prashant Goteti, Ke Huang |
| 2014 | Auto-identification of positive feedback loops in multi-state vulnerable circuits. | Zhiqiang Liu, You Li, Randall L. Geiger, Degang Chen |
| 2014 | A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. | Tao Liu, Chao Fu, Sule Ozev, Bertan Bakkaloglu |
| 2014 | Innovative practices session 2C: Advanced in yield learning. | Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala |
| 2014 | Innovative practices session 3C: Solving today's test challenges. | John Kim, Wolfgang Meyer, T. M. Mak, Amitava Majumdar |
| 2014 | Built-in self test methodology for diagnosis of backend wearout mechanisms in SRAM cells. | Woongrae Kim, Linda Milor |
| 2014 | Innovative practices session 10C: Advances in DFT and compression. | Rohit Kapur, Irith Pomeranz |
| 2014 | Detection, diagnosis, and repair of faults in memristor-based memories. | Sachhidh Kannan, Naghmeh Karimi, Ramesh Karri, Ozgur Sinanoglu |
| 2014 | New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors. | Bozena Kaminska, Bernard Courtois, Mary Ann Maher |
| 2014 | New topic session 2B: Co-design and reliability of power electronic modules - Current status and future challenges. | Bozena Kaminska, Bernard Courtois, Chris Bailey |
| 2014 | Accelerated online error detection in many-core microprocessor architectures. | Manolis Kaliorakis, Mihalis Psarakis, Nikos Foutris, Dimitris Gizopoulos |
| 2014 | Development and empirical verification of an accuracy model for the power down leakage tests. | Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao |
| 2014 | Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test. | Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma, Terri S. Fiez, Mike Peng Li |
| 2014 | Test generation and design-for-testability for flow-based mVLSI microfluidic biochips. | Kai Hu, Tsung-Yi Ho, Krishnendu Chakrabarty |
| 2014 | Phase-locked loop design with SPO detection and charge pump trimming for reference spur suppression. | Sen-Wen Hsiao, Chung-Chun Chen, Randy Caplan, Jeff Galloway, Blake Gray, Abhijit Chatterjee |
| 2014 | Fault modeling and test algorithm creation strategy for FinFET-based memories. | Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian |
| 2014 | Improving CMOS open defect coverage using hazard activated tests. | Chao Han, Adit D. Singh |
| 2014 | Unstructured text: Test analysis techniques applied to non-test problems. | Anne Gattiker |
| 2014 | Accelerating capture of infrequent errors on ATE for silicon TV tuners. | Yongquan Fan, Anant Verma, David S. Trager, Ramin K. Poorfard, John Janney, Sandeep Kumar |