| 2013 | Innovative practices session 7C: Self-calibration & trimming. | Chen-Yong Cher, Yiorgos Makris, C. Thibeault, Alan J. Drake |
| 2013 | Innovative practices session 11C: Resilience. | Chen-Yong Cher, Mohan J. Kumar |
| 2013 | A framework for low overhead hardware based runtime control flow error detection and recovery. | Ameya Chaudhari, Junyoung Park, Jacob A. Abraham |
| 2013 | Special session 11B: Hot topic on-chip clocking - Industrial trends. | Anshuman Chandra |
| 2013 | Selection of tests for outlier detection. | Harm C. M. Bossers, Johann L. Hurink, Gerard J. M. Smit |
| 2013 | A multi-parameter functional side-channel analysis method for hardware trust verification. | Christopher Bell, Matthew Lewandowski, Srinivas Katkoori |
| 2013 | Novel estimation method of EVM with channel correction for linear impairments in multi-standard RF transceivers. | Koji Asami, Takashi Shimura, Toshiaki Kurihara |
| 2013 | Tracing the best test mix through multi-variate quality tracking. | Baris Arslan, Alex Orailoglu |
| 2013 | Test-cost optimization and test-flow selection for 3D-stacked ICs. | Mukesh Agrawal, Krishnendu Chakrabarty |
| 2013 | Defect-oriented non-intrusive RF test using on-chip temperature sensors. | Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet |
| 2012 | Power Characterization of Embedded SRAMs for Power Binning. | Yang Zhao, Lisa Grenier, Amitava Majumdar |
| 2012 | A novel method for fast identification of peak current during test. | Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor |
| 2012 | Net diagnosis using stuck-at and transition fault models. | Lixing Zhao, Vishwani D. Agrawal |
| 2012 | Ping-pong test: Compact test vector generation for reversible circuits. | Masoud Zamani, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty |
| 2012 | On the parametric failures of SRAM in a 3D-die stack considering tier-to-tier supply cross-talk. | Wen Yueh, Subho Chatterjee, Amit Ranjan Trivedi, Saibal Mukhopadhyay |
| 2012 | Direct connection and testing of TSV and microbump devices using NanoPierce™ contactor for 3D-IC integration. | Onnik Yaglioglu, Ben Eldridge |
| 2012 | Enhancing testability by structured partial scan. | Peter Wohl, John A. Waicukauski, Jonathon E. Colburn |
| 2012 | Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution. | Nicholas Tzou, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee |
| 2012 | Self-adaptive power gating with test circuit for on-line characterization of energy inflection activity. | Amit Ranjan Trivedi, Saibal Mukhopadhyay |
| 2012 | A pseudo-dynamic comparator for error detection in fault tolerant architectures. | D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Michael E. Imhof, Hans-Joachim Wunderlich |
| 2012 | Tester-based optical and electrical diagnostic system and techniques. | Peilin Song, Franco Stellari |
| 2012 | Towards spatial fault resilience in array processors. | Suraj Sindia, Vishwani D. Agrawal |
| 2012 | A Bayesian-based process parameter estimation using IDDQ current signature. | Michihiro Shintani, Takashi Sato |
| 2012 | Write-through method for embedded memory with compression Scan-based testing. | Geewhun Seok, Hong Kim, Baker Mohammad |
| 2012 | Estimating Power Supply Noise and its impact on path delay. | Sushmita Kadiyala Rao, Chaitra Sathyanarayana, Ajay Kallianpur, Ryan W. Robucci, Chintan Patel |