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IEEE VLSI Test Symposium

VTS

National

CORE rank

CORE rank (raw)

National/Regional

Fields of research

Computer Systems Engineering

Papers indexed

2,208

1991–2026

Best Computer Systems Engineering conferences

Papers per year

199189 peak2026

Most published authors

VTS papers

2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2013Chip-level modeling and analysis of electrical masking of soft errors.Saman Kiamehr, Mojtaba Ebrahimi, Farshad Firouzi, Mehdi Baradaran Tahoori
2013New topic session 2B: Why (Re-)Designing Biology is ∗Slightly∗ more challenging than designing electronics.Bozena Kaminska, Bernard Courtois, Soha Hassoun
2013New topic session 7B: Challenges and directions for ultra-low voltage VLSI circuits and systems: CMOS and beyond.Bozena Kaminska, Bernard Courtois, Massimo Alioto
2013Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters.Jae Woong Jeong, Sule Ozev, Shreyas Sen, T. M. Mak
2013On-chip circuit for measuring multi-GHz clock signal waveforms.Keith A. Jenkins, Phillip J. Restle, P. Z. Wang, D. Hogenmiller, David W. Boerstler, Thomas J. Bucelot
2013Testing of flow-based microfluidic biochips.Kai Hu, Tsung-Yi Ho, Krishnendu Chakrabarty
2013Distributed dynamic partitioning based diagnosis of scan chain.Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy
2013Testing retention flip-flops in power-gated designs.Hao-Wen Hsu, Shih-Hua Kuo, Wen-Hsiang Chang, Shi-Hao Chen, Ming-Tung Chang, Mango Chia-Tso Chao
2013A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection.Sen-Wen Hsiao, Nicholas Tzou, Abhijit Chatterjee
2013Allocation of RAM built-in self-repair circuits for SOC dies of 3D ICs.Chih-Sheng Hou, Jin-Fu Li
2013Experiences in side channel and testing based Hardware Trojan detection.David Hly, Julien Martin, Gerson Dario Piraquive Triana, Simon Piroux Mounier, Elie Riviere, Thibault Sahuc, Jeremy Savonet, Laura Soundararadjou
2013An effective solution for building memory BIST infrastructure based on fault periodicity.Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian
2013Enhanced algorithm of combining trace and scan signals in post-silicon validation.Kihyuk Han, Joon-Sung Yang, Jacob A. Abraham
2013Innovative practices session 1C: Post-silicon validation.Nagib Hakim, Charles Meissner
2013Trading off area, yield and performance via hybrid redundancy in multi-core architectures.Yue Gao, Yang Zhang, Da Cheng, Melvin A. Breuer
2013On the investigation of built-in tuning of RF receivers using on-chip polyphase filters.Fayrouz Haddad, Wenceslas Rahajandraibe, Hassen Aziza, Karine Castellani-Couli, Jean-Michel Portal
2013RSAK: Random stream attack for phase change memory in video applications.Yuntan Fang, Huawei Li, Xiaowei Li
2013Hot topic session 4A: Reliability analysis of complex digital systems.Adrian Evans, Michael Nicolaidis, Rob Aitken, Burcin Aktan, Olivier Lauzeral
2013Special session 4B: Elevator talks.Jennifer Dworak, Ronald Shawn Blanton, Masahiro Fujita, Kazumi Hatayama, Naghmeh Karimi, Michail Maniatakos, Antonis M. Paschalis, Adit D. Singh, Tian Xia
2013Innovative practices session 2C: Memory test.Charutosh Dixit, Ramesh C. Tekumalla, Sreejit Chakravarty, Manuel d'Abreu, Zhuoyu Bao, Concetta Riccobene
2013Experiments and analysis to characterize logic state retention limitations in 28nm process node.Sachin Dileep Dasnurkar, Animesh Datta, Mohamed H. Abu-Rahma, Hieu Nguyen, Martin Villafana, Hadi Rasouli, Sean Tamjidi, Ming Cai, Samit Sengupta, P. R. Chidambaram, Raghavan Thirumala, Nikhil Kulkarni, Prasanna Seeram, Prasad Bhadri, Prayag Patel, Sei Seung Yoon, Esin Terzioglu
2013Extending pre-silicon delay models for post-silicon tasks: Validation, diagnosis, delay testing, and speed binning.Prasanjeet Das, Sandeep K. Gupta
2013Special session 8B: Embedded tutorial challenges in SSD.Manuel d'Abreu, Amitava Mazumdar
2013Innovative practices session 6C: Latest practices in test compression.Jonathon E. Colburn, Kun Young Chung, Haluk Konuk, Y. Dong
20133D-IC interconnect test, diagnosis, and repair.Chun-Chuan Chi, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin
751–775 of 2,208← PreviousNext →

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