| 2010 | Test cost and test power conflicts: EDA perspective. | Mokhtar Hirech |
| 2010 | Fast path selection for testing of small delay defects considering path correlations. | Zijian He, Tao Lv, Huawei Li, Xiaowei Li |
| 2010 | Special session 8B: New topic MOS/MTJ-hybrid circuit with nonvolatile logic-in-memory architecture and its impact. | Takahiro Hanyu |
| 2010 | Innovative practices session 5C: Post-silicon debug. | Smriti Gupta |
| 2010 | Reusing NoC-infrastructure for test data compression. | Viktor Froese, Rdiger Ibers, Sybille Hellebrand |
| 2010 | Detecting NBTI induced failures in SRAM core-cells. | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
| 2010 | Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. | Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2010 | 3D self testing with Spidergon STNoC. | Marcello Coppola |
| 2010 | iMajik: Making 1149.1 TAPs disappear and reappear in SoCs and 3D packages. | Christopher J. Clark |
| 2010 | Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. | Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo |
| 2010 | Identification of critical primitive path delay faults without any path enumeration. | Kyriakos Christou, Maria K. Michael, Stelios Neophytou |
| 2010 | Power delivery dynamics and its impact on silicon validation. | Eli Chiprout |
| 2010 | Selecting the most relevant structural Fmax for system Fmax correlation. | Janine Chen, Jing Zeng, Li-C. Wang, Jeff Rearick, Michael Mateja |
| 2010 | Low-capture-power at-speed testing using partial launch-on-capture test scheme. | Zhen Chen, Dong Xiang |
| 2010 | On-chip testing of blind and open-sleeve TSVs for 3D IC before bonding. | Po-Yuan Chen, Cheng-Wen Wu, Ding-Ming Kwai |
| 2010 | A novel hybrid delay testing scheme with low test power, volume, and time. | Zhen Chen, Sharad C. Seth, Dong Xiang |
| 2010 | VDDmin test optimization for overscreening minimization through adaptive scan chain masking. | Mingjing Chen, Alex Orailoglu |
| 2010 | Design, analysis, and test of low-power and reliable flexible electronics. | Kwang-Ting Cheng, Tsung-Ching Huang |
| 2010 | Innovative practices session 2C: Design, fabrication and test of flexible electronics. | Kwang-Ting Cheng |
| 2010 | Low cost test and tuning of RF circuits and systems. | Abhijit Chatterjee, Friedrich Taenzler |
| 2010 | Calibration-assisted production testing for digitally-calibrated ADCs. | Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting Cheng |
| 2010 | Special session 11C: Hot topic design consideration and silicon evaluation of on-chip monitors. | Sreejit Chakravarty |
| 2010 | Special session 11B: Hot topic hardware security: Design, test and verification issues. | Swarup Bhunia, Anand Raghunathan |
| 2010 | Low power compression architecture. | Sandeep Bhatia |
| 2010 | Adaptive test delivers wide range of sophisticated test solutions. | K. Arnold |