| 2010 | Power noise and its impact on production test and validation of SoC devices. | Karim Arabi |
| 2010 | Special session 6C: New topic mixed-signal test impact to SoC commercialization. | Karim Arabi |
| 2010 | Ordering of analog specification tests based on parametric defect level estimation. | Nourredine Akkouche, Salvador Mir, Emmanuel Simeu |
| 2010 | Reliable cache design with on-chip monitoring of NBTI degradation in SRAM cells using BIST. | Fahad Ahmed, Linda Milor |
| 2009 | Efficient Array Characterization in the UltraSPARC T2. | Thomas A. Ziaja, Poh J. Tan |
| 2009 | On-Line Calibration and Power Optimization of RF Systems Using a Built-In Detector. | Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham |
| 2009 | Controlling DPPM through Volume Diagnosis. | Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton |
| 2009 | A Synthesis Method to Alleviate Over-Testing of Delay Faults Based on RTL Don't Care Path Identification. | Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara |
| 2009 | Automated Selection of Signals to Observe for Efficient Silicon Debug. | Joon-Sung Yang, Nur A. Touba |
| 2009 | Design-for-Testability for Digital Microfluidic Biochips. | Tao Xu, Krishnendu Chakrabarty |
| 2009 | False Path Aware Timing Yield Estimation under Variability. | Lin Xie, Azadeh Davoodi, Kewal K. Saluja, Abhishek A. Sinkar |
| 2009 | Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure. | Dong Xiang, Boxue Yin, Kwang-Ting Cheng |
| 2009 | Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric. | Zheng Wang, Duncan M. Hank Walker |
| 2009 | Analytical Model for Multi-site Efficiency with Parallel to Serial Test Times, Yield and Clustering. | Naveen Velamati, Robert Daasch |
| 2009 | Stuck-Open Fault Leakage and Testing in Nanometer Technologies. | Julio Csar Vzquez, Vctor H. Champac, Chuck Hawkins, Jaume Segura |
| 2009 | Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. | Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware |
| 2009 | Multiple-Fault Diagnosis Using Faulty-Region Identification. | Meng-Jai Tasi, Mango Chia-Tso Chao, Jing-Yang Jou, Meng-Chen Wu |
| 2009 | Predictive Test Technique for Diagnosis of RF CMOS Receivers. | Kay Suenaga, Sebasti A. Bota, Rodrigo Picos, Eugeni Isern, Miquel Roca, Eugenio Garca-Moreno |
| 2009 | Panel: Analog Characterization and Test: The Long Road to Realization. | Arani Sinha, Amitava Majumdar, Vasu Ganti |
| 2009 | Yield and Cost Analysis of a Reliable NoC. | Saeed Shamshiri, Kwang-Ting Cheng |
| 2009 | Panel: Functional Verification Planning and Management - Are Good Intentions Good Enough? | Andrew Piziali |
| 2009 | Understanding Power Supply Droop during At-Speed Scan Testing. | Pankaj Pant, Joshua Zelman |
| 2009 | Highly X-Tolerant Selective Compaction of Test Responses. | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer |
| 2009 | Output Hazard-Free Transition Delay Fault Test Generation. | Sreekumar Menon, Adit D. Singh, Vishwani D. Agrawal |
| 2009 | Automated Debug of Speed Path Failures Using Functional Tests. | Richard McLaughlin, Srikanth Venkataraman, Carlston Lim |