| 2009 | Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller. | Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris |
| 2009 | Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths. | Junxia Ma, Jeremy Lee, Mohammad Tehranipoor |
| 2009 | Special Session 7C: TTTC 2009 Best Doctoral Thesis Contest. | Yiorgos Makris, Haralampos-G. D. Stratigopoulos |
| 2009 | Automatic Selection of Internal Observation Signals for Design Verification. | Tao Lv, Huawei Li, Xiaowei Li |
| 2009 | Experimental Validation of a BIST Techcnique for CMOS Active Pixel Sensors. | Livier Lizarraga, Salvador Mir, Gilles Sicard |
| 2009 | Soft-Error Hardening Designs of Nanoscale CMOS Latches. | Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi |
| 2009 | Physically-Aware N-Detect Test Relaxation. | Yen-Tzu Lin, Chukwuemeka U. Ezekwe, Ronald D. Blanton |
| 2009 | DFT and Test Problems from the Trenches. | Haluk Konuk |
| 2009 | Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing. | Haluk Konuk |
| 2009 | Panel: Apprentice - VTS Edition: Season 2. | Kee Sup Kim |
| 2009 | STDF Memory Fail Datalog Standard. | Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Songlin Zuo, Liyang Lai, John Rowe, Thomas Zanon |
| 2009 | Special Session 11C: Embedded Tutorial: System-on-a-Chip Power Management Implications on Validation and Testing. | Bhanu Kapoor |
| 2009 | A Scalable, Digital BIST Circuit for Measurement and Compensation of Static Phase Offset. | Keith A. Jenkins, Lionel Li |
| 2009 | Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells. | Yong-Jyun Hu, Yu-Jen Huang, Jin-Fu Li |
| 2009 | An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. | Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker |
| 2009 | Restrict Encoding for Mixed-Mode BIST. | Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jrgen Schlffel, Friedrich Hapke, Andreas Glowatz |
| 2009 | Effective and Efficient Test Pattern Generation for Small Delay Defect. | Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia |
| 2009 | A New Post-Silicon Debug Approach Based on Suspect Window. | Jianliang Gao, Yinhe Han, Xiaowei Li |
| 2009 | Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions. | Edward Flanigan, Spyros Tragoudas, Arkan Abdulrahman |
| 2009 | RT-Level Deviation-Based Grading of Functional Test Sequences. | Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti |
| 2009 | A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources. | Erdem Serkan Erdogan, Sule Ozev |
| 2009 | Exploiting Unused Spare Columns to Improve Memory ECC. | Rudrajit Datta, Nur A. Touba |
| 2009 | Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations. | Bernard Courtois, Chandu Visweswariah |
| 2009 | Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips. | Bernard Courtois, Ali Shakouri |
| 2009 | A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. | Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang |