| 2010 | On multiple bridging faults. | Irith Pomeranz, Sudhakar M. Reddy |
| 2010 | Forming multi-cycle tests for delay faults by concatenating broadside tests. | Irith Pomeranz, Sudhakar M. Reddy |
| 2010 | Special session 4B: Panel low-power test and noise-aware test: Foes or friends? | Ilia Polian |
| 2010 | A novel hybrid method for SDD pattern grading and selection. | Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor |
| 2010 | Innovative practices session 1C: Innovative practices in RF test. | Rubin A. Parekhji |
| 2010 | A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations. | Vishwanath Natarajan, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee |
| 2010 | Innovative practices session 9C: Implications of power delivery network for validation and testing. | Suriyaprakash Natarajan |
| 2010 | Theoretical analysis for low-power test decompression using test-slice duplication. | Szu-Pang Mu, Mango Chia-Tso Chao |
| 2010 | At-speed scan test with low switching activity. | Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab |
| 2010 | Test time reduction using parallel RF test techniques. | Rajesh Mittal, Adesh Sontakke, Rubin A. Parekhji |
| 2010 | Density estimation for analog/RF test problem solving. | Salvador Mir, Haralampos-G. D. Stratigopoulos, Ahcne Bounceur |
| 2010 | High level synthesis of a Front End filter and DSP engine for analog to digital conversion - a case study. | Jose G. Mena, Richard Deken, James E. Coker, Mark S. Johnstone, Sergio R. Ramirez, Peter Frey |
| 2010 | A structured and scalable test access architecture for TSV-based 3D stacked ICs. | Erik Jan Marinissen, Jouke Verbree, Mario Konijnenburg |
| 2010 | Workload-driven selective hardening of control state elements in modern microprocessors. | Michail Maniatakos, Yiorgos Makris |
| 2010 | Special session 12B: Embedded tutorial test and fault tolerance of networks-on-chip. | Marcelo Lubaszewski, rika F. Cota |
| 2010 | Concurrent autonomous self-test for uncore components in system-on-chips. | Yanjing Li, Onur Mutlu, Donald S. Gardner, Subhasish Mitra |
| 2010 | Defect diagnosis based on DFM guidelines. | Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman |
| 2010 | Gate-oxide early-life failure identification using delay shifts. | Young Moon Kim, Tze Wee Chen, Yoshio Kameda, Masayuki Mizuno, Subhasish Mitra |
| 2010 | Panel 12C: Apprentice - VTS edition judging session. | Kee Sup Kim |
| 2010 | Panel 4A: Apprentice - VTS edition: Season 3. | Kee Sup Kim |
| 2010 | The roadblocks to broad adoption of high level synthesis. | Michael Keating |
| 2010 | Special session 9B: New topic test facilities and infrastructure in Canada. | Bozena Kaminska, I. L. McWalter |
| 2010 | Bit line coupling memory tests for single-cell fails in SRAMs. | Sandra Irobi, Zaid Al-Ars, Said Hamdioui |
| 2010 | An ADC/DAC loopback testing methodology by DAC output offsetting and scaling. | Xuan-Lun Huang, Jiun-Lang Huang |
| 2010 | Overview of flexible electronics from ITRI's viewpoint. | Jupiter Hu |