| 2008 | Fault Nodes in Implication Graph for Equivalence/Dominance Collapsing, and Identifying Untestable and Independent Faults. | Rajamani Sethuram, Michael L. Bushnell, Vishwani D. Agrawal |
| 2008 | Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. | Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2008 | Expanded Definition of Functional Operation Conditions and its Effects on the Computation of Functional Broadside Tests. | Irith Pomeranz, Sudhakar M. Reddy |
| 2008 | Synthesis for Broadside Testability of Transition Faults. | Irith Pomeranz, Sudhakar M. Reddy |
| 2008 | Parallel Loopback Test of Mixed-Signal Circuits. | Joonsung Park, Hongjoong Shin, Jacob A. Abraham |
| 2008 | Inconsistent Fail due to Limited Tester Timing Accuracy. | Intaik Park, Donghwi Lee, Erik Chmelar, Edward J. McCluskey |
| 2008 | Basing Acceptable Error-Tolerant Performance on Significance-Based Error-rate (SBER). | Zhaoliang Pan, Melvin A. Breuer |
| 2008 | Test Enabled Process Tuning for Adaptive Baseband OFDM Processor. | Muhammad Mudassar Nisar, Abhijit Chatterjee |
| 2008 | Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors. | Michael Nicolaidis, Renaud Perez, Dan Alexandrescu |
| 2008 | An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. | Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin |
| 2008 | On the Relaxation of n-detect Test Sets. | Stelios Neophytou, Maria K. Michael |
| 2008 | ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends. | Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee |
| 2008 | Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry. | Niladri Narayan Mojumder, Saibal Mukhopadhyay, Jae-Joon Kim, Ching-Te Chuang, Kaushik Roy |
| 2008 | A Time-Domain Method for Pseudo-Spectral Characterization. | Apurva Mishra, Mani Soma |
| 2008 | Algorithm Level Fault Tolerance: A Technique to Cope with Long Duration Transient Faults in Matrix Multiplication Algorithms. | Carlos Arthur Lang Lisba, Costas Argyrides, Dhiraj K. Pradhan, Luigi Carro |
| 2008 | A Built-In TFT Array Charge-Sensing Technique for System-on-Panel Displays. | Chen-Wei Lin, Jiun-Lang Huang |
| 2008 | LS-TDF: Low-Switching Transition Delay Fault Pattern Generation. | Jeremy Lee, Mohammad Tehranipoor |
| 2008 | Error Sequence Analysis. | Jaekwang Lee, Intaik Park, Edward J. McCluskey |
| 2008 | Diagnosis of Scan Clock Failures. | King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman |
| 2008 | Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. | Byoungho Kim, Nash Khouzam, Jacob A. Abraham |
| 2008 | An Industrial Case Study of Sticky Path-Delay Faults. | I-De Huang, Yi-Shing Chang, Sandeep K. Gupta, Sreejit Chakravarty |
| 2008 | Bit-Error Rate Estimation for Bang-Bang Clock and Data Recovery Circuit in High-Speed Serial Links. | Dongwoo Hong, Kwang-Ting (Tim) Cheng |
| 2008 | A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies. | Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi |
| 2008 | An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. | Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian |
| 2008 | A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates. | Manoj Kumar Goparaju, Spyros Tragoudas |