| 2007 | On a New Outlier Rejection Technique. | Claude Thibeault |
| 2007 | Non-RF to RF Test Correlation Using Learning Machines: A Case Study. | Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris |
| 2007 | Design of Test Access Mechanism for AMBA-Based System-on-a-Chip. | Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park |
| 2007 | Alternate Diagnostic Testing and Compensation of RF Transmitter Performance Using Response Detection. | Rajarajan Senguttuvan, Abhijit Chatterjee |
| 2007 | Silicon Evaluation of Static Alternative Fault Models. | Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware |
| 2007 | Diagnosis of Full Open Defects in Interconnecting Lines. | Rosa Rodrguez-Montas, Daniel Arum, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
| 2007 | Transition Fault Testability in Bit Parallel Multipliers over GF(2^{m}). | Hafizur Rahaman, Jimson Mathew, Biplab K. Sikdar, Dhiraj K. Pradhan |
| 2007 | Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression. | Richard Putman, Nur A. Touba |
| 2007 | Autoscan-Invert: An Improved Scan Design without External Scan Inputs or Outputs. | Irith Pomeranz, Sudhakar M. Reddy |
| 2007 | VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips. | Somnath Paul, Rajat Subhra Chakraborty, Swarup Bhunia |
| 2007 | Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. | Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2007 | RF Digital Signal Generation Beyond Nyquist. | Marcelo Negreiros, Ado Antnio de Souza Jr., Luigi Carro, Altamiro Amadeu Susin |
| 2007 | Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios. | Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee, Craig Force |
| 2007 | Power Virus Generation Using Behavioral Models of Circuits. | K. Najeeb, Vishnu Vardhan Reddy Konda, Siva Kumar Sastry Hari, V. Kamakoti, Vivekananda M. Vedula |
| 2007 | Case Study: Soft Error Rate Analysis in Storage Systems. | Brian Mullins, Hossein Asadi, Mehdi Baradaran Tahoori, David R. Kaeli, Kevin Granlund, Rudy Bauer, Scott Romano |
| 2007 | Novel Approach to Clock Fault Testing for High Performance Microprocessors. | Cecilia Metra, Martin Omaa, T. M. Mak, Simon Tam |
| 2007 | Error Tolerance in DNA Self-Assembly by (2k-1) x (2k-1) Snake Tile Sets. | Xiaojun Ma, Jing Huang, Fabrizio Lombardi |
| 2007 | Effects of Embedded Decompression and Compaction Architectures on Side-Channel Attack Resistance. | Chunsheng Liu, Yu Huang |
| 2007 | A Programmable Window Comparator for Analog Online Testing. | Amit Laknaur, Rui Xiao, Haibo Wang |
| 2007 | On Performance Testing with Path Delay Patterns. | Bram Kruseman, Ananta K. Majhi, Guido Gronthoud |
| 2007 | Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications. | Byoungho Kim, Zhenhai Fu, Jacob A. Abraham |
| 2007 | Efficient RTL Coverage Metric for Functional Test Selection. | Jian Kang, Sharad C. Seth, Vijay Gangaram |
| 2007 | Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. | Le Jin, Degang Chen, Randall L. Geiger |
| 2007 | An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs. | Vikram Iyengar, Kenneth Pichamuthu, Andrew Ferko, Frank Woytowich, David E. Lackey, Gary Grise, Mark Taylor, Mike Degregorio, Steven F. Oakland |
| 2007 | A Low Cost Spectral Power Extraction Technique for RF Transceiver Testing. | T.-L. Hung, J.-L. Huang |