| 2006 | Interconnect Testing for Networks on Chips. | Khadija Jirari Stewart, Spyros Tragoudas |
| 2006 | Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. | Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler |
| 2006 | Output Hazard-Free Transition Tests for Silicon Calibrated Scan Based Delay Testing. | Adit D. Singh, Gefu Xu |
| 2006 | Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. | Hongjoong Shin, Byoungho Kim, Jacob A. Abraham |
| 2006 | X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. | Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya |
| 2006 | Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification. | Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman |
| 2006 | Dominance Based Analysis for Large Volume Production Fail Diagnosis. | Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy |
| 2006 | A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. | Lus Rolndez, Salvador Mir, Ahcne Bounceur, Jean-Louis Carbonro |
| 2006 | Nanofabric Topologies and Reconfiguration Algorithms to Support Dynamically Adaptive Fault Tolerance. | Wenjing Rao, Alex Orailoglu, Ramesh Karri |
| 2006 | Modular Compactor of Test Responses. | Wojciech Rajski, Janusz Rajski |
| 2006 | SCT: An Approach For Testing and Configuring Nanoscale Devices. | Reza M. Rad, Mohammad Tehranipoor |
| 2006 | Enhanced Timing-Based Transition Delay Testing for Small Delay Defects. | Richard Putman, Rahul Gawde |
| 2006 | Session Abstract. | Praveen Parvathala |
| 2006 | Session Abstract. | Rubin A. Parekhji |
| 2006 | Session Abstract. | Phil Nigh |
| 2006 | Session Abstract. | Michael Nicolaidis |
| 2006 | Path Delay Fault Simulation on Large Industrial Designs. | Suriyaprakash Natarajan, Srinivas Patil, Sreejit Chakravarty |
| 2006 | Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. | Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | BIST Pretest of ICs: Risks and Benefits. | Yoshiyuki Nakamura, Jacob Savir, Hideo Fujiwara |
| 2006 | Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework. | Fang Liu, Plamen K. Nikolov, Sule Ozev |
| 2006 | Thermal-Aware Testing of Network-on-Chip Using Multiple-Frequency Clocking. | Chunsheng Liu, Vikram Iyengar, Dhiraj K. Pradhan |
| 2006 | Robust Test Generation for Precise Crosstalk-induced Path Delay Faults. | Huawei Li, Pei-Fu Shen, Xiaowei Li |
| 2006 | The Impacts of Untestable Defects on Transition Fault Testing. | Xijiang Lin, Janusz Rajski |
| 2006 | A Low-Cost Solution for Protecting IPs Against Scan-Based Side-Channel Attacks. | Jeremy Lee, Mohammad Tehranipoor, Jim Plusquellic |
| 2006 | Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding. | Jinkyu Lee, Nur A. Touba |