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IEEE VLSI Test Symposium

VTS

National

CORE rank

CORE rank (raw)

National/Regional

Fields of research

Computer Systems Engineering

Papers indexed

2,208

1991–2026

Papers per year

199189 peak2026

VTS papers

2,208 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2006Session Abstract.Yervant Zorian, Dennis Wassung
2006Session Abstract.Yervant Zorian, Bruce C. Kim
2006Design Optimization for Robustness to Single Event Upsets.Quming Zhou, Mihir R. Choudhury, Kartik Mohanram
2006Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes.Rong Zhang, Zeljko Zilic, Katarzyna Radecka
2006Scan Tests with Multiple Fault Activation Cycles for Delay Faults.Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski
2006Awards.
2006Test Technology Educational Program (TTEP) Tutorials.
2006Test Technology Technical Council (TTTC).
2006Acknowledgments.
2006Reviewers.
2006Program Committee.
2006Steering Committee.
2006Organizing Committee.
2006Forward.
2006Session Abstract.Cheng-Wen Wu
2006A New ATPG Method for Efficient Capture Power Reduction During Scan Testing.Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita
2006RF Front-end System Gain and Linearity Built-in Test.Qi Wang, Mani Soma
2006Improved Handling of False and Multicycle Paths in ATPG.Vlado Vorisek, Bruce Swanson, Kun-Han Tsai, Dhiraj Goswami
2006Efficient Fault Collapsing via Generalized Dominance Relations.Vishnu C. Vimjam, Michael S. Hsiao
2006Session Abstract.Andreas G. Veneris, Yiorgos Makris
2006Session Abstract.James W. Tschanz
2006Silicon Evaluation of Logic Proximity Bridge Patterns.Eric N. Tran, Vishwashanth Kasulasrinivas, Sreejit Chakravarty
2006Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations.Rasit Onur Topaloglu
2006Mixed PLB and Interconnect BIST for FPGAs Without Fault-Free Assumptions.Vishal Suthar, Shantanu Dutt
2006Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing.Haralampos-G. D. Stratigopoulos, Yiorgos Makris
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