| 2006 | Decision Tree Based Mismatch Diagnosis in Analog Circuits. | Mingjing Chen, Hosam Haggag, Alex Orailoglu |
| 2006 | Session Abstract. | R. Chandramouli |
| 2006 | Exploiting Regularity for Inductive Fault Analysis. | Jason G. Brown, R. D. (Shawn) Blanton |
| 2006 | Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?. | Sebasti A. Bota, M. Rosales, Jos Luis Rossell, Jaume Segura |
| 2006 | A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. | Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2006 | Functional Test of Field Programmable Analog Arrays. | Tiago R. Balen, Jos Vicente Calvano, Marcelo Lubaszewski, Michel Renovell |
| 2006 | Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. | Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | On the Automation of the Test Flow of Complex SoCs. | Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
| 2006 | Session Abstract. | Davide Appello |
| 2006 | Upper Bounding Fault Coverage by Structural Analysis and Signal Monitoring. | Vishwani D. Agrawal, Soumitra Bose, Vijay Gangaram |
| 2006 | Multi-Cycle Sensitizable Transition Delay Faults. | Jais Abraham, Uday Goel, Arun Kumar |
| 2005 | Flash Memory Built-In Self-Diagnosis with Test Mode Control. | Jen-Chieh Yeh, Yan-Ting Lai, Yuan-Yuan Shih, Cheng-Wen Wu, Chien-Hung Ho, Yen-Tai Lin |
| 2005 | VTS 2004 Best Innovative Practices Session Award. | |
| 2005 | VTS 2004 Best Panel Award. | |
| 2005 | VTS 2004 Best Paper Award. | |
| 2005 | Test Technology Educational Program: Overview of Tutorials. | |
| 2005 | Test Technology Technical Council. | |
| 2005 | Acknowledgments. | |
| 2005 | Reviewers. | |
| 2005 | Program Committee. | |
| 2005 | Steering Committee. | |
| 2005 | Organizing Committee. | |
| 2005 | Foreword. | |
| 2005 | Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST. | Peter Wohl, John A. Waicukauski, Sanjay Patel, Cy Hay, Emil Gizdarski, Ben Mathew |
| 2005 | On Low-Capture-Power Test Generation for Scan Testing. | Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |