| 1998 | Distributed Generation of Weighted Random Patterns. | Jacob Savir |
| 1998 | Design of Phase Shifters for BIST Applications. | Janusz Rajski, Jerzy Tyszer |
| 1998 | Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model. | Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian |
| 1998 | Synthesis of Zero-Aliasing Elementary-Tree Space Compactors. | Bahram Pouya, Nur A. Touba |
| 1998 | Stuck-At Tuple-Detection: A Fault Model Based on Stuck-At Faults for Improved Defect Coverage. | Irith Pomeranz, Sudhakar M. Reddy |
| 1998 | On Synchronizing Sequences and Test Sequence Partitioning. | Irith Pomeranz, Sudhakar M. Reddy |
| 1998 | Towards Simultaneous Delay-Fault Built-In Self-Test and Partial-Scan Insertion. | Ganapathy Parthasarathy, Michael L. Bushnell |
| 1998 | Parallelism in Structural Fault Testing of Embedded Cores. | Mehrdad Nourani, Christos A. Papachristou |
| 1998 | Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores. | Petra Nordholz, Dieter Treytnar, Jan Otterstedt, Hartmut Grabinski, Dirk Niggemeyer, T. W. Williams |
| 1998 | Using Verification Technology for Validation Coverage Analysis and Test Generation. | Dinos Moundanos, Jacob A. Abraham |
| 1998 | Test Reuse at System Level. | Jos M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman |
| 1998 | Analysis of Failures in Deep Submicron SRAM Cells. | Pinaki Mazumder |
| 1998 | Best Methods for At-Speed Testing? | Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh |
| 1998 | Mixed Signal DFT at GHz Frequencies. | Ralph Mason, Shing Ma |
| 1998 | On Delay-Untestable Paths and Stuck-Fault Redundancy. | Subhashis Majumder, Vishwani D. Agrawal, Michael L. Bushnell |
| 1998 | Ground Bounce Considerations in DC Parametric Test Generation Using Boundary Scan. | Amitava Majumdar, Michio Komoda, Tim Ayres |
| 1998 | Implications of Voltage and Dimension Scaling on CMOS Testing: The Multidimensional Testing Paradigm. | Ovidio V. Maiuri, Will R. Moore |
| 1998 | On Removing Redundant Faults in Synchronous Sequential Circuits. | Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy |
| 1998 | Partial Reset and Scan for Flip-Flops Based on States Requirement for Test Generation. | Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen |
| 1998 | Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits. | Kyung Tek Lee, Clay Nordquist, Jacob A. Abraham |
| 1998 | A Design for Testability Study on a High Performance Automatic Gain Control Circuit. | Andreas Lechner, Andrew Richardson, B. Hermes, Michael J. Ohletz |
| 1998 | Estimation of Error Detection Probability and Latency of Checking Methods for a Given Circuit under Check. | Arsen Kuchukyan |
| 1998 | Designing a Testable System on a Chip. | Stephen V. Kosonocky, Arthur A. Bright, Kevin W. Warren, Ruud A. Haring, Steve Klepner, Sameh W. Asaad, S. Basavaiah, Bob Havreluk, David F. Heidel, Michael Immediato, Keith A. Jenkins, Rajiv V. Joshi, Benjamin D. Parker, T. V. Rajeevakumar, Kevin Stawiasz |
| 1998 | Novel Single and Double Output TSC Berger Code Checkers. | Xrysovalantis Kavousianos, Dimitris Nikolos |
| 1998 | An Introduction to RF Testing: Device, Method and System. | Jeffrey S. Kasten |