| 1995 | Resynthesis for sequential circuits designed with a specified initial state. | Hiroyuki Yotsuyanagi, Seiji Kajihara, Kozo Kinoshita |
| 1995 | An experimental evaluation of the differential BICS for I | Walter W. Weber, Adit D. Singh |
| 1995 | On the decline of testing efficiency as fault coverage approaches 100%. | Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams |
| 1995 | Reducing test application time in scan design schemes. | Bapiraju Vinnakota, Nicholas J. Stessman |
| 1995 | A solution for the on-line test of analog ladder filters. | Diego Vzquez, Adoracin Rueda, Jos L. Huertas |
| 1995 | Testability metrics for synthesis of self-testable designs and effective test plans. | Mahsa Vahidi, Alex Orailoglu |
| 1995 | Transformed pseudo-random patterns for BIST. | Nur A. Touba, Edward J. McCluskey |
| 1995 | Detection and location of faults and defects using digital signal processing. | Claude Thibeault |
| 1995 | A low cost 100 MHz analog test bus. | Stephen K. Sunter |
| 1995 | Improving the efficiency of error identification via signature analysis. | Charles E. Stroud, T. Raju Damarla |
| 1995 | Signature analysis and aliasing for sequential circuits. | Albrecht P. Stroele |
| 1995 | On the design of at-speed testable VLSI circuits. | Mohamed Soufi, Yvon Savaria, Bozena Kaminska |
| 1995 | An approach for system tests design and its application. | Samvel K. Shoukourian, Armen G. Kostanian, Valery A. Margarian, Ayman A. Ashour |
| 1995 | Circuit design for low overhead delay-fault BIST using constrained quadratic 0-1 programming . | Imtiaz P. Shaik, Michael L. Bushnell |
| 1995 | An approach to dynamic power consumption current testing of CMOS ICs. | Jaume A. Segura, Miquel Roca, Diego Mateo, Antonio Rubio |
| 1995 | Self-test in a VCM driver chip. | Lahouari Sebaa, Norm Gardner, Robert Neidorff, Rich Valley |
| 1995 | On shrinking wide compressors. | Jacob Savir |
| 1995 | Test preparation for high coverage of physical defects in CMOS digital ICs. | Marcelino B. Santos, M. Simes, Isabel C. Teixeira, Joo Paulo Teixeira |
| 1995 | Detecting I | Josep Rius, Joan Figueras |
| 1995 | Fault coverage analysis of RAM test algorithms. | Marc D. Riedel, Janusz Rajski |
| 1995 | The concept of resistance interval: a new parametric model for realistic resistive bridging fault. | Michel Renovell, P. Huc, Yves Bertrand |
| 1995 | Compact test generation for bridging faults under I | Remata S. Reddy, Irith Pomeranz, Sudhakar M. Reddy, Seiji Kajihara |
| 1995 | Scan testing of micropipelines. | O. A. Petlin, Stephen B. Furber |
| 1995 | Asynchronous multiple scan chain. | Sridhar Narayanan, Melvin A. Breuer |
| 1995 | VISION: an efficient parallel pattern fault simulator for synchronous sequential circuits. | Rajesh Nair, Dong Sam Ha |