| 1994 | Impact of behavioral modifications for testability. | Thomas Thomas, Praveen Vishakantaiah, Jacob A. Abraham |
| 1994 | Controllable self-checking checkers for conditional concurrent checking. | Steffen Tarnick |
| 1994 | Design of fully testable circuits by functional decomposition and implicit test pattern generation. | Bernd Steinbach, M. Stckert |
| 1994 | An organization of the test bus for analog and mixed-signal systems. | Janusz A. Starzyk, Zhi-Hong Liu, Jun Zou |
| 1994 | Fault probabilities in routing channels of VLSI standard cell designs. | G. Spiegel |
| 1994 | A power supply ramping and current measurement based technique for analog fault diagnosis. | Shyam S. Somayajula, Edgar Snchez-Sinencio, Jos Pineda de Gyvez |
| 1994 | A design-for-test technique for switched-capacitor filters. | Mani Soma, Vladimir Kolarik |
| 1994 | ICAT: incremental combinational ATPG. | Byung S. So, Charles R. Kime |
| 1994 | Multifrequency testability analysis for analog circuits. | Mustapha Slamani, Bozena Kaminska |
| 1994 | Incorporating IDDQ testing in BIST: improved coverage through test diversity. | Adit D. Singh, Jason P. Hurst |
| 1994 | Boundary-scan: beyond production test. | Richard M. Sedmark |
| 1994 | On broad-side delay test. | Jacob Savir, Srinivas Patil |
| 1994 | Discrete test generation by continuous methods. | Igor Rivin, Srimat T. Chakradhar |
| 1994 | CMOS bridging fault modeling. | Michel Renovell, P. Huc, Yves Bertrand |
| 1994 | Correlating defect level to final test fault coverage for modular structured designs [microcontroller family]. | Theo J. Powell, Kenneth M. Butler, Mike Ales, Roy Haley, Mark Perry |
| 1994 | On identifying undetectable and redundant faults in synchronous sequential circuits. | Irith Pomeranz, Sudhakar M. Reddy |
| 1994 | Limitations in predicting defect level based on stuck-at fault coverage. | Jaehong Park, Mark Naivar, Rohit Kapur, M. Ray Mercer, Thomas W. Williams |
| 1994 | Efficient UBIST for RAMs. | Michael Nicolaidis |
| 1994 | Multiple weighted cellular automata. | Danial J. Neebel, Charles R. Kime |
| 1994 | Functional learning: a new approach to learning in digital circuits. | Rajarshi Mukherjee, Jawahar Jain, Dhiraj K. Pradhan |
| 1994 | Input pattern classification for transistor level testing of BiCMOS circuits. | Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya |
| 1994 | Eliminating undetectable shorts between horizontal wires during channel routing. | Richard McGowen, F. Joel Ferguson |
| 1994 | Quality impacts of non-uniform fault coverage. | Peter C. Maxwell |
| 1994 | Architecture of test support ICs for mixed-signal testing. | Jos Silva Matos, Joo Canas Ferreira, Ana C. Leo, Jos Machado da Silva |
| 1994 | Open faults in BiCMOS gates. | Siyad C. Ma, Edward J. McCluskey |