| 1995 | Real-time on-board bus testing. | Jeffrey A. Floyd, Matt Perry |
| 1995 | Diagnosis of scan path failures. | Samantha Edirisooriya, Geetani Edirisooriya |
| 1995 | Test pattern generation for I | Marcello Dalpasso, Michele Favalli, Piero Olivo |
| 1995 | Cyclic stress tests for full scan circuits. | Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel |
| 1995 | A portable ATPG tool for parallel and distributed systems. | Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda, Enzo Veiluva |
| 1995 | Improving topological ATPG with symbolic techniques. | Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda, Uwe Glser, Heinrich Theodor Vierhaus |
| 1995 | Partial scan designs without using a separate scan clock. | Kwang-Ting Cheng |
| 1995 | A novel pattern generator for near-perfect fault-coverage. | Mitrajit Chatterjee, Dhiraj K. Pradhan |
| 1995 | Testability of floating gate defects in sequential circuits. | Vctor H. Champac, Joan Figueras |
| 1995 | Redundancy Removal and Test Generation for Circuits with Non-Boolean Primitives. | Srimat T. Chakradhar, Steven G. Rothweiler |
| 1995 | Simulation of at-speed tests for stuck-at faults. | Tapan J. Chakraborty, Vishwani D. Agrawal |
| 1995 | Structural constraints for circular self-test paths. | Joan Carletta, Christos A. Papachristou |
| 1995 | A gate-array based 500 MHz triple channel ATE controller with 40 pS timing verniers. | Steve Brown, Germn Gutirrez, Reed Nelson, Chris VanKrevelen |
| 1995 | Reliability evaluation of combinational logic circuits by symbolic simulation. | Alessandro Bogliolo, Maurizio Damiani, Piero Olivo, Bruno Ricc |
| 1995 | Synthesis of combinational circuits with special fault-handling capabilitie. | Alessandro Bogliolo, Maurizio Damiani |
| 1995 | Verification of transient response of linear analog circuits. | Ashok Balivada, Yatin Vasant Hoskote, Jacob A. Abraham |
| 1995 | Iddt testing of continuous-time filters. | Javier Argelles, Mara Jos Lpez, J. Blanco, Mar Martnez, Salvador Bracho |
| 1994 | New advances in path delay fault testing of combinational circuits. | Xiaodong Xie, Alexander Albicki |
| 1994 | Weighted random robust path delay testing of synthesized multilevel circuits. | Weili Wang, Sandeep K. Gupta |
| 1994 | Coverage metrics for functional tests. | John R. Wallack, Ramaswami Dandapani |
| 1994 | A new strategy for testing analog filters. | Diego Vzquez, Adoracin Rueda, Jos Luis Huertas |
| 1994 | Known-good-die technologies on the horizon. | Barbara Vasquez, Don R. Van Overloop, Scott E. Lindsey |
| 1994 | On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions. | Valery A. Vardanian |
| 1994 | Speeding up behavioral test pattern generation using an algorithmic improvement. | Loc Vandeventer, Jean Franois Santucci, Norbert Giambiasi |
| 1994 | A BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC. | Michael F. Toner, Gordon W. Roberts |