| 1994 | Test generation and three-state elements, buses, and bidirectionals. | J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor |
| 1994 | Test embedding with discrete logarithms. | Mody Lempel, Sandeep K. Gupta, Melvin A. Breuer |
| 1994 | Sequential test generation with reduced test clocks for partial scan designs. | Soo Young Lee, Kewal K. Saluja |
| 1994 | Circuit-level dictionaries of CMOS bridging faults. | Terry Lee, Weitong Chuang, Ibrahim N. Hajj, W. Kent Fuchs |
| 1994 | Designing self-exercising analogue checkers. | Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois |
| 1994 | Novel architectures for TSC/CD and SFS/SCD synchronous controllers. | Sayed Mohammad Kia, Sri Parameswaran |
| 1994 | Realization of fully path-delay-fault testable non-scan sequential circuits. | Wuudiann Ke, Premachandran R. Menon |
| 1994 | On compacting test sets by addition and removal of test vectors. | Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita, Sudhakar M. Reddy |
| 1994 | A design for testability technique for test pattern generation with LFSRs. | Dimitrios Kagaris, Spyros Tragoudas |
| 1994 | Analyzing the design-for-test techniques in a multiple substrate MCM. | Joel A. Jorgenson, Russell J. Wagner |
| 1994 | Aliasing error for a mask ROM built-in self-test. | Kazuhiko Iwasaki, Akinori Furuta, Shigeo Nakamura |
| 1994 | Analysis of I | Eugeni Isern, Joan Figueras |
| 1994 | FACTS: fault coverage estimation by test vector sampling. | Keerthi Heragu, Vishwani D. Agrawal, Michael L. Bushnell |
| 1994 | Analog circuit observer blocks. | Ramesh Harjani, Bapiraju Vinnakota |
| 1994 | Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. | Michael Gssel, Egor S. Sogomonyan |
| 1994 | Fault models and tests for Ring Address Type FIFOs. | Ad J. van de Goor, Ivo Schanstra, Yervant Zorian |
| 1994 | Automating the verification of memory tests. | Ad J. van de Goor, B. Smit |
| 1994 | Functional design verification for the PowerPC 601 microprocessor. | Scott Glenn, Gavin Meil, Ed Rodriguez, Jeff Brooks |
| 1994 | A new high level testability measure: description and evaluation. | M.-H. Gentil, Didier Crestani, Abdennour El Rhalibi, C. Durante |
| 1994 | Linear finite state machine for lD ILAs. | Murali M. R. Gala, Peter Utama, Don E. Ross, Karan L. Watson |
| 1994 | Three-pattern tests for delay faults. | Piero Franco, Edward J. McCluskey |
| 1994 | On-line delay testing of digital circuits. | Piero Franco, Edward J. McCluskey |
| 1994 | Fault detection and fault localization using I | Christian Elm, Djamshid Tavangarian |
| 1994 | Delay-fault testability preservation of the concurrent decomposition and factorization transformations. | Aiman El-Maleh, Janusz Rajski |
| 1994 | Synthesizing designs with low-cardinality minimum feedback vertex set for partial scan application. | Sujit Dey, Miodrag Potkonjak, Rabindra K. Roy |