| 1994 | Retiming sequential circuits to enhance testability. | Sujit Dey, Srimat T. Chakradhar |
| 1994 | On robustness of required random test length with regard to fault occurrence hypotheses. | Sophie Crpaux-Motte, Mireille Jacomino, Ren David |
| 1994 | Neural models for transistor and mixed-level test generation. | Carolina L. C. Cooper, Michael L. Bushnell |
| 1994 | On evaluating competing bridge fault models for CMOS ICs. | Brian Chess, Carl Roth, Tracy Larrabee |
| 1994 | Gate-to-channel shorts in BiCMOS logic gates. | C.-J. Chen, Samiha Mourad |
| 1994 | Design for diagnosability of linear digital filters using time-space expansion. | Abhijit Chatterjee, Rabindra K. Roy |
| 1994 | Diagnostic simulation of stuck-at faults in combinational circuits. | Sreejit Chakravarty, Yiming Gong |
| 1994 | Structural constraints for circular self-test paths. | Joan Carletta, Christos A. Papachristou |
| 1994 | An industrial experience in the built-in self test of embedded RAMs. | Paolo Camurati, Paolo Prinetto, Matteo Sonza Reorda, Stefano Barbagallo, Andrea Burri, Davide Medina |
| 1994 | A new functional fault model for system-level descriptions. | Paolo Camurati, Fulvio Corno, Michela Meo, Paolo Prinetto |
| 1994 | Design for testability of on-line multipliers. | Hakim Bederr, Michael Nicolaidis, Alain Guyot |
| 1993 | A distributed BIST control scheme for complex VLSI devices. | Yervant Zorian |
| 1993 | Minimal hardware multiple signature analysis for BIST. | Yuejian Wu, Andr Ivanov |
| 1993 | An IEEE 1149.1 based voltmeter/oscilloscope in a chip. | Lee Whetsel |
| 1993 | Improvement of analog circuit fault detectability using fault detection observers. | Wolfgang Vermeiren, Wolfgang Straube, Gnter Elst |
| 1993 | A structured design for test methodology. | Kumar Venkat |
| 1993 | LFSR based deterministic hardware for at-speed BIST. | Beena Vasudevan, Don E. Ross, Murali M. R. Gala, Karan L. Watson |
| 1993 | Generation of testable designs from behavioral descriptions using high level synthesis tools. | Kamal K. Varma, Praveen Vishakantaiah, Jacob A. Abraham |
| 1993 | Quiescent current estimation based on quality requirements. | Fabian Luis Vargas, Michael Nicolaidis, B. Hamdi |
| 1993 | Revisiting shift register realization for ease of test generation and testing. | Shunichi Toida |
| 1993 | Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing. | Friedrich Taenzler, Thomas Novak, Erich Kubalek |
| 1993 | A model for testing reliable VLSI routing architectures. | Constantine Stivaros |
| 1993 | Combinational circuit ATPG using binary decision diagrams. | Sanjay Srinivasan, Gnanasekaran Swaminathan, James H. Aylor, M. Ray Mercer |
| 1993 | On the check base selection problem for fast adders. | Uwe Sparmann |
| 1993 | Incremental test pattern generation. | Sang-Hoon Song, Larry L. Kinney |