Seiji Kajihara
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
61
Venues
14
Active years
1993–2022
Best venue rank
A*
Where they publish
Papers
61 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2022 | ITC | A Practical Online Error Detection Method for Functional Safety Using Three-Site Implications. | Kazuya Loki, Yasuyuki Kai, Kohei Miyase, Seiji Kajihara |
| 2020 | IOLTS | On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test. | Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura |
| 2020 | VTS | Innovative Test Practices in Asia. | Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama |
| 2019 | PRDC | On-Chip Delay Measurement for In-Field Test of FPGAs. | Yousuke Miyake, Yasuo Sato, Seiji Kajihara |
| 2017 | ITC | Analysis and mitigation or IR-Drop induced scan shift-errors. | Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen |
| 2015 | ETS | Identification of high power consuming areas with gate type and logic level information. | Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara |
| 2014 | PRDC | Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA. | Yasuo Sato, Masafumi Monden, Yousuke Miyake, Seiji Kajihara |
| 2013 | VLSID | On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression. | Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang |
| 2012 | ETS | On-chip temperature and voltage measurement for field testing. | Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara |
| 2012 | ITC | DART: Dependable VLSI test architecture and its implementation. | Yasuo Sato, Seiji Kajihara, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue, Yukiya Miura, Satosni Untake, Takumi Hasegawa, Motoyuki Sato, Kotaro Shimamura |
| 2012 | ITC | On pinpoint capture power management in at-speed scan test generation. | Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang |
| 2012 | VTS | A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. | Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara |
| 2011 | DATE | Transition-Time-Relation based capture-safety checking for at-speed scan test generation. | Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara |
| 2011 | DSN | Genetic algorithm based approach for segmented testing. | Xiaoxin Fan, Sudhakar M. Reddy, Senling Wang, Seiji Kajihara, Yasuo Sato |
| 2011 | ISLPED | SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. | Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich |
| 2011 | ITC | A novel scan segmentation design method for avoiding shift timing failure in scan testing. | Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang |
| 2011 | VTS | Power-aware test generation with guaranteed launch safety for at-speed scan testing. | Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor |
| 2010 | ETS | On estimation of NBTI-Induced delay degradation. | Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura |
| 2010 | IOLTS | Aging test strategy and adaptive test scheduling for SoC failure prediction. | Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara |
| 2009 | ICCAD | A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. | Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara |
| 2009 | PRDC | A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. | Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara |
| 2008 | DDECS | Diagnosis of Realistic Defects Based on the X-Fault Model. | Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen |
| 2008 | ETS | A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja |
| 2008 | ICCAD | Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. | Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara |
| 2007 | DAC | Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja |
| 2007 | ICCAD | Estimation of delay test quality and its application to test generation. | Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo |
| 2007 | ITC | A novel scheme to reduce power supply noise for high-quality at-speed scan testing. | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang |
| 2006 | ASPDAC | A dynamic test compaction procedure for high-quality path delay testing. | Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2006 | ICCD | Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja |
| 2006 | ITC | A Framework of High-quality Transition Fault ATPG for Scan Circuits. | Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2006 | VTS | A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. | Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Khader S. Abdel-Hafez, Kozo Kinoshita |
| 2005 | ASPDAC | Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. | Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty |
| 2005 | ASPDAC | Evaluation of the statistical delay quality model. | Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara |
| 2005 | DAC | Path delay test compaction with process variation tolerance. | Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2005 | ITC | Invisible delay quality - SDQM model lights up what could not be seen. | Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Nozuyama, Seiji Kajihara |
| 2005 | ITC | Low-capture-power test generation for scan-based at-speed testing. | Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2005 | VLSID | Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores. | Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Shivakumar Swaminathan |
| 2005 | VTS | On Low-Capture-Power Test Generation for Scan Testing. | Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2004 | ETS | Enhanced 3-valued logic/fault simulation for full scan circuits using implicit logic values. | Seiji Kajihara, Kewal K. Saluja, Sudhakar M. Reddy |
| 2004 | ICCAD | On per-test fault diagnosis using the X-fault model. | Xiaoqing Wen, Tokiharu Miyoshi, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |
| 2004 | VLSID | Random Access Scan: A solution to test power, test data volume and test time. | Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara |
| 2003 | ASPDAC | On effective criterion of path selection for delay testing. | Masayasu Fukunaga, Seiji Kajihara, Sadami Takeoka, Shinichi Yosimura |
| 2003 | ICCD | A Method to Find Don't Care Values in Test Sequences for Sequential Circuits. | Yoshinobu Higami, Shin-ya Kobayashi, Yuzo Takamatsu, Seiji Kajihara, Irith Pomeranz |
| 2003 | ICCD | On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. | Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty |
| 2002 | ETS | On selecting testable paths in scan designs. | Yun Shao, Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara |
| 2002 | ICCD | Don't-Care Identification on Specific Bits of Test Patterns. | Kohei Miyase, Seiji Kajihara, Irith Pomeranz, Sudhakar M. Reddy |
| 2002 | ITC | On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout. | Sudhakar M. Reddy, Irith Pomeranz, Huaxing Tang, Seiji Kajihara, Kozo Kinoshita |
| 2002 | VTS | Test Vector Modification for Power Reduction during Scan Testing. | Seiji Kajihara, Koji Ishida, Kohei Miyase |
| 2002 | VTS | On Test Data Volume Reduction for Multiple Scan Chain Designs. | Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz |
| 2001 | ICCAD | On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits. | Seiji Kajihara, Kohei Miyase |
| 2000 | ITC | Selection of potentially testable path delay faults for test generation. | Atsushi Murakami, Seiji Kajihara, Tsutomu Sasao, Irith Pomeranz, Sudhakar M. Reddy |
| 2000 | ITC | On validating data hold times for flip-flops in sequential circuits. | Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara, Atsushi Murakami, Sadami Takeoka, Mitsuyasu Ohta |
| 1998 | VLSID | On Test Pattern Compaction Using Random Pattern Fault Simulation. | Seiji Kajihara, Kewal K. Saluja |
| 1997 | VLSID | A Method for Identifying Robust Dependent and Functionally Unsensitizable Paths. | Seiji Kajihara, Kozo Kinoshita, Irith Pomeranz, Sudhakar M. Reddy |
| 1996 | VTS | On the effects of test compaction on defect coverage. | Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara |
| 1995 | VTS | Compact test generation for bridging faults under I | Remata S. Reddy, Irith Pomeranz, Sudhakar M. Reddy, Seiji Kajihara |
| 1995 | VTS | Resynthesis for sequential circuits designed with a specified initial state. | Hiroyuki Yotsuyanagi, Seiji Kajihara, Kozo Kinoshita |
| 1994 | ITC | Reduced Scan Shift: A New Testing Method for Sequential Circuit. | Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita |
| 1994 | VTS | On compacting test sets by addition and removal of test vectors. | Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita, Sudhakar M. Reddy |
| 1993 | DAC | Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits. | Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita, Sudhakar M. Reddy |
| 1993 | ICCAD | Test generation for multiple faults based on parallel vector pair analysis. | Seiji Kajihara, Tetsuji Sumioka, Kozo Kinoshita |