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International Symposium on Design and Diagnostics of Electronic Circuits and Systems

DDECS

C

CORE rank

CORE rank (raw)

C

Fields of research

Computer Systems Engineering

Papers indexed

1,124

2006–2026

Papers per year

200691 peak2026

DDECS papers

1,124 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2010Ultra low-voltage bidirectional current mirror using clocked semi-floating-gate transistors.Yngvar Berg
2010Instruction reliability analysis for embedded processors.Ali Azarpeyvand, Mostafa E. Salehi, Farshad Firouzi, Amir Yazdanbakhsh, Sied Mehdi Fakhraie
2010Combined matched filter and arbitrary interpolator for symbol timing synchronization in SDR receivers.Mehmood-ur-Rehman Awan, Peter Koch
2010Memory elements based on minority-3 gates and inverters implemented in 90 nm CMOS.Snorre Aunet, Amir Hasanbegovic
2010Data compression in hardware - The Burrows-Wheeler approach.Sebastian Arming, Roman Fenkhuber, Thomas Handl
2010Safety features of SoCs: How can they be re-used?Davide Appello
2010A 0.4 V bulk-input pseudo amplifier in 90nm CMOS technology.Arash Ahmadpour
2010Self-Adaptive mechanism for cache memory reliability improvement.Liviu Agnola, Mircea Vladutiu, Mihai Udrescu
2010Design - Time configurable processor basic structure.Filip Adamec, Tomas Fryza
2009Simulation and planning method for on-chip power distribution - An industry perspective.Qing K. Zhu, Vincent Bars
2009Fast congestion-aware timing-driven placement for island FPGA.Jinpeng Zhao, Qiang Zhou, Yici Cai
2009A CMOS bio-impedance measurement system.Alberto Yufera, Adoracin Rueda
2009Test scheme for switched-capacitor circuits by digital analyses.Yun-Che Wen
2009Self-timed thermal sensing and monitoring of multicore systems.Kameswar Rao Vaddina, Ethiopia Nigussie, Pasi Liljeberg, Juha Plosila
2009A 1GHz-GBW operational amplifier for DVB-H receivers in 65nm CMOS.Heimo Uhrmann, Franz Schlgl, Kurt Schweiger, Horst Zimmermann
2009On the role of the power supply as an entry for common cause faults - An experimental analysis.Peter Tummeltshammer, Andreas Steininger
2009Contactless characterization of MEMS devices using optical microscopy.Andrs Timr, Gyrgy Bognr
2009A fast untestability proof for SAT-based ATPG.Daniel Tille, Rolf Drechsler
2009Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing.Yiorgos Sfikas, Yiorgos Tsiatouhas
2009Low-voltage low-power double bulk mixer for direct conversion receiver in 65nm CMOS.Kurt Schweiger, Heimo Uhrmann, Horst Zimmermann
2009Effective BIST for crosstalk faults in interconnects.Tomasz Rudnicki, Tomasz Garbolino, Krzysztof Gucwa, Andrzej Hlawiczka
2009Structural test of programmed FPGA circuits.Martin Rozkovec, Ondrej Novk
2009Using 3-valued memory representation for state space reduction in embedded assembly code model checking.Thomas Reinbacher, Martin Horauer, Bastian Schlich
2009Investigating the linearity of MOSFET-only switched-capacitor DeltaSigma modulators under low-voltage condition.Farhad Alibeygi Parsan, Ahmad Ayatollahi, Adib Abrishamifar
2009Optimization concepts for self-healing asynchronous circuits.Thomas Panhofer, Werner Friesenbichler, Martin Delvai
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