| 2006 | An Extension of Transient Fault Emulation Techniques to Circuits with Embedded Memories. | Mario Garca-Valderas, Marta Portela-Garca, Celia Lpez-Ongil, Luis Entrena-Arrontes |
| 2006 | Detection, Localisation and Identification of Interconnection Faults Using MISR Compactor. | Tomasz Garbolino, Michal Kopec, Krzysztof Gucwa, Andrzej Hlawiczka |
| 2006 | A Core Generator for Multi-ALU Processors Utilized in Genetic Parallel Programming. | Zbysek Gajda |
| 2006 | Multiple-Vector Column-Matching BIST Design Method. | Petr Fiser, Hana Kubtov |
| 2006 | A Modified Debugging Infrastructure to Assist Real Time Fault Injection Campaigns. | Andr V. Fidalgo, Gustavo R. Alves, Jos M. Ferreira |
| 2006 | Probabilistic Testability Analysis and DFT Methods at RTL. | Jos M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, Joo Paulo Teixeira |
| 2006 | A Low Power 2.5 Gbps 1: 32 Deserializer in SiGe BiCMOS Technology. | Flix Tobajas, Roberto Esper-Chan, Ral Regidor, Octavio Santana, Roberto Sarmiento |
| 2006 | PE-ICE: Parallelized Encryption and Integrity Checking Engine. | Reouven Elbaz, Lionel Torres, Gilles Sassatelli, Pierre Guillemin, Michel Bardouillet |
| 2006 | Automatic Identification of Timing Anomalies for Cycle-Accurate Worst-Case Execution Time Analysis. | Jochen Eisinger, Ilia Polian, Bernd Becker, Alexander Metzner, Stephan Thesing, Reinhard Wilhelm |
| 2006 | A System for Transforming an ANSI C Code with OpenMP Directives into a SystemC Description. | Piotr Dziurzanski, Wlodzimierz Bielecki, Konrad Trifunovic, M. Kleszczonek |
| 2006 | March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2006 | A Switch Supporting Circuit and Packet Switching for On-Chip Networks. | Hsin-Chou Chi, Chia-Ming Wu, Sung-Tze Wu |
| 2006 | Comparing Subtraction-Free and Traditional AMI. | Jir Bucek, Rbert Lrencz |
| 2006 | A Leakage-based Random Bit Generator with On-line Fault Detection. | Marco Bucci, Raimondo Luzzi |
| 2006 | Die Attach Quality Testing by Fully Contact-less Measurement Method. | Gyrgy Bognr, Gyula Horvth, Zoltn Szucs, Vladimr Szkely |
| 2006 | Concurrent Testing of Digital Circuits for Advanced Fault Models. | Santosh Biswas, Siddhartha Mukhopadhyay, P. Patra, Dipankar Sarkar |
| 2006 | Test Considerations about the Structured ASIC Paradigm. | Paolo Bernardi, Michelangelo Grosso |
| 2006 | A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2006 | ISA Based Functional Test Generation with Application to Self-Test of RISC Processors. | V. V. Belkin, S. G. Sharshunov |
| 2006 | A Sinewave Analyzer for Mixed-Signal BIST Applications in a 0.35m Technology. | Manuel J. Barragan Asian, Diego Vzquez, Adoracin Rueda |
| 2006 | Lissajous Based Mixed-Signal Testing for N-Observable Signals. | Luz Balado, Emili Lupon, L. Garca, Rosa Rodrguez-Montas, Joan Figueras |
| 2006 | Low Level Bus Traffic Replay for the Test and Debugging of Time-Triggered Communication Systems. | Eric Armengaud |
| 2006 | Parallel Memory Architecture for Arbitrary Stride Accesses. | Eero Aho, Jarno Vanne, Timo D. Hmlinen |
| 2006 | Statistical Model for Logic Errors in CMOS Digital Circuits for Reliability-Driven Design Flow. | Mohamed Abbas, Makoto Ikeda, Kunihiro Asada |