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IEEE European Test Symposium

ETS

B

CORE rank

CORE rank (raw)

B

Fields of research

Computer Systems Engineering

Papers indexed

1,163

1999–2026

Papers per year

199968 peak2026

ETS papers

1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2019Approximate computing design exploration through data lifetime metrics.Alessandro Savino, Michele Portolan, Rgis Leveugle, Stefano Di Carlo
2019Impact of Reduced Precision in the Reliability of Deep Neural Networks for Object Detection.Fernando Fernandes dos Santos, Philippe O. A. Navaux, Luigi Carro, Paolo Rech
2019Back-annotation of Interconnect Physical Properties for System-Level Crosstalk Modeling.Rezgar Sadeghi, Nooshin Nosrati, Katayoon Basharkhah, Zainalabedin Navabi
2019Alternatives to Fault Injections for Early Safety/Security Evaluations.Michele Portolan, Alessandro Savino, Rgis Leveugle, Stefano Di Carlo, Alberto Bosio, Giorgio Di Natale
2019A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks.Michele Portolan, Riccardo Cantoro, Ernesto Snchez
2019PaTran: Translation Platform for Test Pattern Program.Jung-Geun Park, Minsu Kim, Soo-Mook Moon, Sungyeol Kim, Insu Yang, Hyunsoo Jung
2019High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors.Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Grsoy, Jaan Raik
2019LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology.Soumya Mittal, R. D. Shawn Blanton
2019DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs.Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui
2019A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip.A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, Matteo Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi
2019A 52 dB-SFDR 166 MHz sinusoidal signal generator for mixed-signal BIST applications in 28 nm FDSOI technology.Hani Malloug, Manuel J. Barragn, Salvador Mir
2019STAHL: A Novel Scan-Test-Aware Hardened Latch Design.Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu
2019Model-driven AMS Test Setup Validation Tool prepared for IEEE P1687.2.Leon M. A. van de Logt, Vladimir A. Zivkovic, Ingrid H. A. van Baast
2019On Generating Fault Diagnosis Patterns for Designs with X Sources.Xijiang Lin, Sudhakar M. Reddy
2019Revisiting Logic Locking for Reversible Computing.Nimisha Limaye, Muhammad Yasin, Ozgur Sinanoglu
2019Hardware-Based Aging Mitigation Scheme for Memory Address Decoder.Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
2019Security in Autonomous Systems.Stefan Katzenbeisser, Ilia Polian, Francesco Regazzoni, Marc Stttinger
2019Test Solutions for High Density 3D-IC Interconnects - Focus on SRAM-on-Logic Partitioning.Imed Jani, Didier Lattard, Pascal Vivet, Jean Durupt, Sbastien Thuries, Edith Beign
2019Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection.Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2019Exploring Algebraic Interpolants for Rectification of Finite Field Arithmetic Circuits with Grbner Bases.Utkarsh Gupta, Priyank Kalla, Irina Ilioaea, Florian Enescu
2019K3 TAM Optimization for Testing 3D-SoCs using Non-Regular Time-Division-Multiplexing.Panagiotis Georgiou, Iakovos Theodosopoulos, Xrysovalantis Kavousianos
2019Dependable Wireless Industrial IoT Networks: Recent Advances and Open Challenges.Fotis Foukalas, Paul Pop, Fabrice Theoleyre, Carlo Alberto Boano, Chiara Buratti
2019B-open: A New Defect in Nanometer Technologies due to SADP Process.Freddy Forero, Michel Renovell, Vctor H. Champac
2019Symbolic Circuit Analysis under an Arc Based Timing Model.Grschwin Fey, Alberto Garca Ortiz
2019Machine Learning-based Prediction of Test Power.Harshad Dhotre, Stephan Eggersgl, Krishnendu Chakrabarty, Rolf Drechsler
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