| 2019 | Test Pattern Generator for Majority Voter based QCA Combinational Circuits targeting MMC Defect. | Vaishali H. Dhare, Usha Mehta |
| 2019 | Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks. | Aleksa Damljanovic, Artur Jutman, Giovanni Squillero, Anton Tsertov |
| 2019 | Built-in Self-Test for Inter-Layer Vias in Monolithic 3D ICs. | Arjun Chaudhuri, Sanmitra Banerjee, Heechun Park, Bon Woong Ku, Krishnendu Chakrabarty, Sung Kyu Lim |
| 2019 | A Dynamic Greedy Test Scheduler for Optimizing Probe Motion in In-Circuit Testers. | Luciano Bonaria, Maurizio Raganato, Matteo Sonza Reorda, Giovanni Squillero |
| 2019 | IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation. | Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff |
| 2019 | Test Adapted Shielding by a Multipurpose Crosstalk Avoidance Scheme. | Mahsa Akhsham, Atefesadat Seyedolhosseini, Zainalabedin Navabi |
| 2019 | Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling. | Foisal Ahmed, Michihiro Shintani, Michiko Inoue |
| 2019 | Non-Adaptive Pattern Reordering to Improve Scan Chain Diagnostic Resolution. | Yu Huang, Jakub Janicki, Szczepan Urban |
| 2019 | Hybrid Architecture for Embedded Test Compression to Process Rejected Test Patterns. | Sebastian Huhn, Daniel Tille, Rolf Drechsler |
| 2018 | A software reconfigurable assertion checking unit for run-time error detection. | Yumin Zhou, Sebastian Burg, Oliver Bringmann, Wolfgang Rosenstiel |
| 2018 | Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262. | Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima |
| 2018 | Machine learning applications in IC testing. | Haralampos-G. D. Stratigopoulos |
| 2018 | Towards the formal verification of security properties of a Network-on-Chip router. | Johanna Seplveda, Damian Aboul-Hassan, Georg Sigl, Bernd Becker, Matthias Sauer |
| 2018 | ADC test methods using an impure stimulus: A survey. | Jan Schat |
| 2018 | Automatic generation of in-circuit tests for board assembly defects. | Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen |
| 2018 | Detection of IJTAG attacks using LDPC-based feature reduction and machine learning. | Xuanle Ren, R. D. (Shawn) Blanton, Vtor Grade Tavares |
| 2018 | Methodology for determining the influencing factors of lifetime variation for power devices. | Ciprian V. Pop, Andi Buzo, Georg Pelz, Horia Cucu, Corneliu Burileanu |
| 2018 | Interconnect-aware tests to complement gate-exhaustive tests. | Irith Pomeranz, Srikanth Venkataraman |
| 2018 | Covering undetected transition fault sites with optimistic unspecified transition faults under multicycle tests. | Irith Pomeranz |
| 2018 | Model-based avionic systems testing for the airbus family. | Jan Peleska |
| 2018 | Sense amplifier offset characterisation and test implications for low-voltage SRAMs in 65 nm. | Dhruv Patel, Derek Wright, Manoj Sachdev |
| 2018 | ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks. | Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee |
| 2018 | An efficient fault-tolerant valve-based microfluidic routing fabric for single-cell analysis. | Yasamin Moradi, Krishnendu Chakrabarty, Ulf Schlichtmann |
| 2018 | Design of fault-tolerant neuromorphic computing systems. | Mengyun Liu, Lixue Xia, Yu Wang, Krishnendu Chakrabarty |
| 2018 | IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers. | Yu Li, Ming Shao, Hailong Jiao, Adam Cron, Sandeep Bhatia, Erik Jan Marinissen |