| 2018 | Device aging: A reliability and security concern. | Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi |
| 2018 | Measuring mixed-signal test stimulus quality. | Krzysztof Jurga, Stephen Sunter |
| 2018 | BISTs for post-bond test and electrical analysis of high density 3D interconnect defects. | Imed Jani, Didier Lattard, Pascal Vivet, Lucile Arnaud, Edith Beign |
| 2018 | On no-reference on-line error-tolerability testing for videos. | Tong-Yu Hsieh, Shang-En Chan, Chi-Hsuan Ho |
| 2018 | The impact of production defects on the soft-error tolerance of hardened latches. | Stefan Holst, Ruijun Ma, Xiaoqing Wen |
| 2018 | Extending post-silicon coverage measurement using time-multiplexed FPGA overlays. | Fatemeh Eslami, Eddie Hung, Steven J. E. Wilton |
| 2018 | Challenges in Cell-Aware Test. | Shreyas Pramod Dixit, Divyeshkumar Dhanjibhai Vora, Ke Peng |
| 2018 | Modeling and testing comparison faults of memristive ternary content addressable memories. | Li-Wei Deng, Jin-Fu Li, Yong-Xiao Chen |
| 2018 | Hardware Trojan detection using path delay order encoding with process variation tolerance. | Xiaotong Cui, Kaijie Wu, Ramesh Karri |
| 2018 | Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits. | Florent Cilici, Manuel J. Barragn, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel |
| 2018 | Covering hard-to-detect defects by thermal quorum sensing. | Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen |
| 2018 | Locking of biochemical assays for digital microfluidic biochips. | Sukanta Bhattacharjee, Jack Tang, Mohamed Ibrahim, Krishnendu Chakrabarty, Ramesh Karri |
| 2018 | Design and testing methodologies for true random number generators towards industry certification. | Josep Balasch, Florent Bernard, Viktor Fischer, Milos Grujic, Marek Laban, Oto Petura, Vladimir Rozic, Gerard van Battum, Ingrid Verbauwhede, Marnix Wakker, Bohan Yang |
| 2018 | On the mitigation of single event transients on flash-based FPGAs. | Sarah Azimi, Boyang Du, Luca Sterpone |
| 2018 | Online prevention of security violations in reconfigurable scan networks. | Ahmed Atteya, Michael A. Kochte, Matthias Sauer, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich |
| 2018 | Recycled IC detection through aging sensor. | Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Sudhakar M. Reddy |
| 2017 | Improving the dependability of AMR sensors used in automotive applications. | Andreina Zambrano, Hans G. Kerkhoff |
| 2017 | Automatic testing of analog ICs for latent defects using topology modification. | Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
| 2017 | Probabilistic sensitization analysis for variation-aware path delay fault test evaluation. | Marcus Wagner, Hans-Joachim Wunderlich |
| 2017 | SIC pair generation in optimal time using rotatable counters. | Ioannis Voyiatzis |
| 2017 | Mitigating read & write errors in STT-MRAM memories under DVS. | Elena-Ioana Vatajelu, Rosa Rodrguez-Montas, Michel Renovell, Joan Figueras |
| 2017 | Periodic Bias-Temperature Instability monitoring in SRAM cells. | Yiorgos Tsiatouhas |
| 2017 | Extension of power supply impedance emulation method on ATE for multiple power domain. | Naoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada |
| 2017 | A phase locking test solution for MEMS devices. | Tareq Muhammad Supon, Rashid Rashidzadeh |
| 2017 | Coverage-driven mixed-signal verification of smart power ICs in a UVM environment. | Sebastian Simon, Deeksha Bhat, Alexander W. Rath, Jrme Kirscher, Linus Maurer |