IEEE European Test Symposium
ETS
B
CORE rank
CORE rank (raw)
B
Fields of research
Computer Systems Engineering
Papers indexed
1,163
1999–2026
Papers per year
199968 peak2026
Most published authors
ETS papers
1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2017 | Scan chain encryption for the test, diagnosis and debug of secure circuits. | Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo |
| 2017 | Online Profiling for cluster-specific variable rate refreshing in high-density DRAM systems. | Rasool Sharifi, Zainalabedin Navabi |
| 2017 | Contact-less near-field measurement of RF phased array antenna mismatches. | Maryam Shafiee, Sule Ozev |
| 2017 | Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps. | Marcelino Seif, Emna Farjallah, Franck Badets, Emna Chabchoub, Christophe Layer, Jean-Marc Armani, Francis Joffre, Costin Anghel, Luigi Dilillo, Valentin Gherman |
| 2017 | ISO26262-compliant soft-error mitigation in register banks. | Jan Schat |
| 2017 | Exploiting STT-MRAM for approximate computing. | Nour Sayed, Fabian Oboril, Azadeh Shirvanian, Rajendra Bishnoi, Mehdi Baradaran Tahoori |
| 2017 | Mixed-signal BIST computation offloading using IEEE 1687. | Michele Portolan, Manuel J. Barragn, Rshdee Alhakim, Salvador Mir |
| 2017 | Application-aware lifetime estimation of power devices. | Ciprian V. Pop, Corneliu Burileanu, Andi Buzo, Georg Pelz |
| 2017 | Counteracting malicious faults in cryptographic circuits. | Ilia Polian, Francesco Regazzoni |
| 2017 | ROM fault diagnosis for O(n | Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2017 | Extended binary nonlinear codes and their application in testing and compression. | Ondrej Novk |
| 2017 | Multiple-defect diagnosis for Logic Characterization Vehicles. | Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton |
| 2017 | Foreword. | Maria K. Michael, Rolf Drechsler, Stephan Eggersgl, Haralampos-G. D. Stratigopoulos, Sybille Hellebrand, Rob Aitken |
| 2017 | Bridge over troubled waters: Critical area based pattern generation. | Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh |
| 2017 | Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology. | Hani Malloug, Manuel J. Barragan Asian, Salvador Mir, Laurent Basteres, Herv Le Gall |
| 2017 | Integrated circuits' characterization for non-normal data in semiconductor quality analysis. | Ingrid Kovacs, Marina Dana Topa, Andi Buzo, Georg Pelz |
| 2017 | Specification and verification of security in reconfigurable scan networks. | Michael A. Kochte, Matthias Sauer, Laura Rodrguez Gmez, Pascal Raiola, Bernd Becker, Hans-Joachim Wunderlich |
| 2017 | Impact of the switching activity on the aging of delay-PUFs. | Naghmeh Karimi, Jean-Luc Danger, Mariem Slimani, Sylvain Guilley |
| 2017 | Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. | Amit Karel, Florence Azas, Mariane Comte, Jean-Marc Gallire, Michel Renovell, Keshav Singh |
| 2017 | Detecting hardware Trojans without a Golden IC through clock-tree defined circuit partitions. | Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue, Alex Orailoglu |
| 2017 | Low power probabilistic online monitoring of systematic erroneous behaviour. | Mauricio D. Gutierrez, Vasileios Tenentes, Tom J. Kazmierski, Daniele Rossi |
| 2017 | Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification. | Tong Guan, Zhaobo Zhang, Wen Dong, Chunming Qiao, Xinli Gu |
| 2017 | Aging-aware coding scheme for memory arrays. | Mohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori |
| 2017 | A homogeneous framework for AMS languages instrumentation, abstraction and simulation. | Enrico Fraccaroli, Luca Piccolboni, Franco Fummi |
| 2017 | A very low cost and highly parallel DfT method for analog and mixed-signal circuits. | Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen |
451–475 of 1,163← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- AITCIEEE International Test Conference
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design