| 2017 | Volume diagnosis data mining. | Wu-Tung Cheng, Yue Tian, Sudhakar M. Reddy |
| 2017 | Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs. | Amir Charif, Nacer-Eddine Zergainoh, Alexandre Coelho, Michael Nicolaidis |
| 2017 | A built-in self-test scheme for classifying refresh periods of DRAMs. | Chia-Ming Chang, Yong-Xiao Chen, Jin-Fu Li |
| 2017 | Real-time self-learning for control law adaptation in nonlinear systems using encoded check states. | Suvadeep Banerjee, Abhijit Chatterjee |
| 2017 | Automated area and coverage optimization of minimal latency checkers. | Siavoosh Payandeh Azad, Behrad Niazmand, Apneet Kaur Sandhu, Jaan Raik, Gert Jervan, Thomas Hollstein |
| 2017 | Security and trust in the analog/mixed-signal/RF domain: A survey and a perspective. | Angelos Antonopoulos, Christiana Kapatsori, Yiorgos Makris |
| 2017 | An efficient test technique to prevent scan-based side-channel attacks. | Satyadev Ahlawat, Darshit Vaghani, Virendra Singh |
| 2017 | Derivation of the reliability metric for digital circuits. | Mohamed A. Abufalgha, Alex Bystrov |
| 2017 | Best paper. | Bernd Becker, Adit D. Singh |
| 2016 | Compressor design for silicon debug. | Jing Zhang, Lars-Johan Fritz, Liang Liu, Erik Larsson |
| 2016 | A self-reconfiguring IEEE 1687 network for fault monitoring. | Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson |
| 2016 | Testing of small delay faults in a clock network. | Shaofu Yang, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng |
| 2016 | ETS 2015 best paper. | Hans-Joachim Wunderlich, Peter C. Maxwell |
| 2016 | A built-in method for measuring the delay of TSVs in 3D ICs. | Han-Yu Wu, Yong-Xiao Chen, Jin-Fu Li |
| 2016 | Is IoT coming to the rescue of semiconductor? | Cheng-Wen Wu |
| 2016 | A fast sweep-line-based failure pattern extractor for memory diagnosis. | Sin-Yu Wei, Bing-Yang Lin, Cheng-Wen Wu |
| 2016 | A design-for-test solution for monolithic 3D integrated circuits. | Ran Wang, Krishnendu Chakrabarty |
| 2016 | A low-cost susceptibility analysis methodology to selectively harden logic circuits. | Imran Wali, Bastien Deveautour, Arnaud Virazel, Alberto Bosio, Patrick Girard, Matteo Sonza Reorda |
| 2016 | Study of a delayed single-event effect in the Muller C-element. | Varadan Savulimedu Veeravalli, Andreas Steininger |
| 2016 | Bit-flip detection-driven selection of trace signals. | Amin Vali, Nicola Nicolici |
| 2016 | A hybrid algorithm to conservatively check the robustness of circuits. | Niels Thole, Lorena Anghel, Grschwin Fey |
| 2016 | Measuring defect tolerance within mixed-signal ICs. | Stephen Sunter, Alessandro Valerio, Riccardo Miglierina |
| 2016 | Cell Aware and stuck-open tests. | Adit D. Singh |
| 2016 | Group delay filter measurement using a chirp. | Peter Sarson |
| 2016 | Securely connected vehicles - what it takes to make self-driving cars a reality. | Lars Reger |