| 2016 | Component fault localization using switching current measurements. | Seetal Potluri, Satya Trinadh, Siddhant Saraf, Kamakoti Veezhinathan |
| 2016 | A novel test generation and application flow for functional access to IEEE 1687 instruments. | Michele Portolan |
| 2016 | A scheduling method for hierarchical testability based on test environment generation results. | Jun Nishimaki, Toshinori Hosokawa, Hideo Fujiwara |
| 2016 | A novel threshold voltage defined switch for circuit camouflaging. | Ithihasa Reddy Nirmala, Deepak Vontela, Swaroop Ghosh, Anirudh Iyengar |
| 2016 | Testing in the year 2024 - big changes are coming. | Phil Nigh |
| 2016 | The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator. | Illani Mohd Nawi, Basel Halak, Mark Zwolinski |
| 2016 | Cross-layer resilience. | Subhasish Mitra |
| 2016 | Behavior and test of open-gate defects in FinFET based cells. | Francisco Mesalles, Hector Villacorta, Michel Renovell, Vctor H. Champac |
| 2016 | Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC. | Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue |
| 2016 | Cell-aware diagnosis: Defective inmates exposed in their cells. | Peter C. Maxwell, Friedrich Hapke, Huaxing Tang |
| 2016 | IoT: Source of test challenges. | Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang, Dave Singele, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes |
| 2016 | IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs. | Erik Jan Marinissen, Teresa L. McLaurin, Hailong Jiao |
| 2016 | Transistor stuck-on fault detection tests for digital CMOS circuits. | Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski |
| 2016 | Questioning the reliability of Monte Carlo simulation for machine learning test validation. | Gildas Lger, Manuel J. Barragn |
| 2016 | Analysis of electrostatic coupling in monolithic 3D integrated circuits and its impact on delay testing. | Abhishek Koneru, Krishnendu Chakrabarty |
| 2016 | Formal verification of secure reconfigurable scan network infrastructure. | Michael A. Kochte, Rafal Baranowski, Matthias Sauer, Bernd Becker, Hans-Joachim Wunderlich |
| 2016 | Failure mechanisms and test methods for the SRAM TVC write-assist technique. | Josef Kinseher, Moritz Vlker, Leonardo Bonet Zordan, Ilia Polian |
| 2016 | On coverage of timing related faults at board level. | Artur Jutman, Igor Aleksejev, Sergei Devadze |
| 2016 | Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. | Ahmed Ibrahim, Hans G. Kerkhoff |
| 2016 | VecTHOR: Low-cost compression architecture for IEEE 1149-compliant TAP controllers. | Sebastian Huhn, Stephan Eggersgl, Rolf Drechsler |
| 2016 | ETS 2016 foreword. | Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos |
| 2016 | Utilizing shared memory multi-cores to speed-up the ATPG process. | Stavros Hadjitheophanous, Stelios N. Neophytou, Maria K. Michael |
| 2016 | CPE: Codeword Prediction Encoder. | Satish Grandhi, Elsa Dupraz, Christian Spagnol, Valentin Savin, Emanuel M. Popovici |
| 2016 | Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator. | Antonio J. Gins, Eduardo J. Peralas, Gildas Lger, Adoracin Rueda, Guillaume Renaud, Manuel J. Barragn, Salvador Mir |
| 2016 | Two-dimensional time-division multiplexing for 3D-SoCs. | Panagiotis Georgiou, Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty |