IEEE European Test Symposium
ETS
B
CORE rank
CORE rank (raw)
B
Fields of research
Computer Systems Engineering
Papers indexed
1,163
1999–2026
Papers per year
199968 peak2026
Most published authors
ETS papers
1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2016 | Automotive embedded software architecture in the multi-core age. | Paolo Gai, Massimo Violante |
| 2016 | An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability. | Tasuku Fujibe, Kazuki Shirahata, Takeshi Mizushima, Hidenobu Matsumura, Daisuke Watanabe, Hiroyuki Mineo, Shin Masuda |
| 2016 | SAT-based post-processing for regional capture power reduction in at-speed scan test generation. | Stephan Eggersgl, Kohei Miyase, Xiaoqing Wen |
| 2016 | A new EDA flow for the mitigation of SEUs in dynamic reconfigurable FPGAs. | Boyang Du, Luca Sterpone, David Merodio Codinachs |
| 2016 | IJTAG supported 3D DFT using chiplet-footprints for testing multi-chips active interposer system. | Jean Durupt, Pascal Vivet, Juergen Schloeffel |
| 2016 | Test-station for flexible semi-automatic wafer-level silicon photonics testing. | Jeroen De Coster, Peter De Heyn, Marianna Pantouvaki, Brad Snyder, Hongtao Chen, Erik Jan Marinissen, Philippe Absil, Joris Van Campenhout, Bryan Bolt |
| 2016 | Combining the histogram method and the ultrafast segmented model identification of linearity errors algorithm for ADC linearity testing. | Weida Chen, Yongxin Zhu, Xinyi Liu, Xinyang Li, Dongyu Ou |
| 2016 | A 40Gbps economic extension board and FPGA-based testing platform. | Te-Hui Chen, David C. Keezer |
| 2016 | Addressing transient routing errors in fault-tolerant Networks-on-Chips. | Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2016 | On the diagnostic analysis of IEEE 1687 networks. | Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson |
| 2016 | In situ measurement of aging-induced performance degradation in digital circuits. | Nasim Pour Aryan, Christian Funke, Jens Bargfrede, Cenk Yilmaz, Doris Schmitt-Landsiedel, Georg Georgakos |
| 2016 | Read path degradation analysis in SRAM. | Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene |
| 2016 | Practices in High-Speed IO testing. | Salem Abdennadher, Saghir A. Shaikh |
| 2015 | Testing visions. | Hans-Joachim Wunderlich |
| 2015 | New drain current model for nano-meter MOS transistors on-chip threshold voltage test. | Jinbo Wan, Hans G. Kerkhoff |
| 2015 | An effective hybrid fault-tolerant architecture for pipelined cores. | Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard |
| 2015 | Symmetric transparent on-line BIST of word-organized memories with binary adders. | Ioannis Voyiatzis |
| 2015 | Power-aware voltage tuning for STT-MRAM reliability. | Elena I. Vatajelu, Rosa Rodrguez-Montas, Stefano Di Carlo, Marco Indaco, Michel Renovell, Paolo Prinetto, Joan Figueras |
| 2015 | A branch-&-bound algorithm for TAM optimization in multi-Vdd SoCs. | Fotios Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty |
| 2015 | A Bayesian model for system level reliability estimation. | Alessandro Vallero, Alessandro Savino, Sotiris Tselonis, Nikos Foutris, Manolis Kaliorakis, Gianfranco Politano, Dimitris Gizopoulos, Stefano Di Carlo |
| 2015 | Diagnosis of power switches with power-distribution-network consideration. | Vasileios Tenentes, Daniele Rossi, S. Saqib Khursheed, Bashir M. Al-Hashimi |
| 2015 | A soft-error tolerant TCAM using partial don't-care keys. | Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase |
| 2015 | On resistive open defect detection in DRAMs: The charge accumulation effect. | Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui |
| 2015 | Software-based repair for memories in tiny embedded systems. | Mario Schlzel, Patryk Skoncej |
| 2015 | Improving test pattern generation in presence of unknown values beyond restricted symbolic logic. | Karsten Scheibler, Dominik Erb, Bernd Becker |
526–550 of 1,163← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- AITCIEEE International Test Conference
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design