| 2015 | NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating. | Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi |
| 2015 | Is adaptive testing the panacea for the future test problems? | Zebo Peng |
| 2015 | Evaluating the self-testing property of AES' finite field inversion units. | Flavius Opritoiu, Mircea Vladutiu |
| 2015 | Tackling the complexity of exact path delay fault grading for path intensive circuits. | Stelios N. Neophytou, Maria K. Michael |
| 2015 | Identification of high power consuming areas with gate type and logic level information. | Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara |
| 2015 | LSI aging estimation using ring oscillators. | Yukiya Miura, Tatsunori Ikeda |
| 2015 | An ECC-based memory architecture with online self-repair capabilities for reliability enhancement. | Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato |
| 2015 | Reliability analysis for power MOSFET based on multi-physics simulation. | Shuo Li, Hong Wang, Shiyuan Yang |
| 2015 | Boundary cost optimization for Alternate Test. | Gildas Lger |
| 2015 | Improve the compression ratios for code-based test vector compressions by decomposing. | Jishun Kuang, Liang Zhang, Zhiqiang You, Yingbo Zhou |
| 2015 | Testing of Analog/Mixed Signal ICs: Past, present and future. | Bram Kruseman |
| 2015 | Cyber-physical systems: A security perspective. | Charalambos Konstantinou, Michail Maniatakos, Fareena Saqib, Shiyan Hu, Jim Plusquellic, Yier Jin |
| 2015 | An FPGA-based ATE extension module for low-cost multi-GHz memory test. | David C. Keezer, Te-Hui Chen, Thomas Moon, D. T. Stonecypher, Abhijit Chatterjee, Hyun Woo Choi, Sungyeol Kim, Hosun Yoo |
| 2015 | Efficient diagnosis technique for aging defects on automotive semiconductor chips. | Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park |
| 2015 | Robust amplitude measurement for RF BIST applications. | Jae Woong Jeong, Jennifer Kitchen, Sule Ozev |
| 2015 | Designing area-efficient controllers for multi-cycle transient fault tolerant systems. | Tsuyoshi Iwagaki, Yutaro Ishimori, Hideyuki Ichihara, Tomoo Inoue |
| 2015 | A practical approach for logic simplification based on fault acceptability for error tolerant application. | Hideyuki Ichihara, Junpei Kamei, Tsuyoshi Iwagaki, Tomoo Inoue |
| 2015 | Advancements in diagnosis driven yield analysis (DDYA): A survey of state-of-the-art scan diagnosis and yield analysis technologies. | Yu Huang, Wu Yang, Wu-Tung Cheng |
| 2015 | A low capture power test generation method using capture safe test vectors. | Atsushi Hirai, Yukari Yamauchi, Toshinori Hosokawa, Masayuki Arai |
| 2015 | Variability-aware aging modeling for reliability analysis of an analog neural measurement system. | Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen |
| 2015 | Expanding the boundaries of test and diagnostics: Prognostics and Health Management (PHM) for complex systems. | Douglas Goodman |
| 2015 | Aging guardband reduction through selective flip-flop optimization. | Mohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
| 2015 | On test program compaction. | Marco Gaudesi, Matteo Sonza Reorda, Irith Pomeranz |
| 2015 | High frequency jitter estimator for SoCs. | Herv Le Gall, Rshdee Alhakim, Miroslav Valka, Salvador Mir, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu |
| 2015 | A fault tolerant response analyzer with self-error-correction capability. | Yuki Fukazawa, Hideyuki Ichihara, Tomoo Inoue |