| 2015 | Session-less based thermal-aware 3D-SIC test scheduling. | Marie-Lise Flottes, Joao Azevedo, Giorgio Di Natale, Bruno Rouzeyre |
| 2015 | Re-using BIST for circuit aging monitoring. | Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori |
| 2015 | Improving RO-PUF quality on FPGAs by incorporating design-dependent frequency biases. | Linus Feiten, Tobias Martin, Matthias Sauer, Bernd Becker |
| 2015 | Compact test set generation for test compression-based designs. | Stephan Eggersgl |
| 2015 | Testing of digital microfluidic biochips with arbitrary layouts. | Trung Anh Dinh, Shigeru Yamashita, Tsung-Yi Ho, Krishnendu Chakrabarty |
| 2015 | A new technique for low-cost phase noise production testing from 1-bit signal acquisition. | Stephane David-Grignot, Florence Azas, Laurent Latorre, Francois Lefevre |
| 2015 | Automatic generation of autonomous built-in observability structures for analog circuits. | Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen |
| 2015 | Reliability-aware operation chaining in high level synthesis. | Liang Chen, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori |
| 2015 | Software-based self-test techniques of computational modules in dual issue embedded processors. | Paolo Bernardi, C. Bovi, Riccardo Cantoro, Sergio de Luca, Renato Meregalli, Davide Piumatti, Ernesto Snchez, Alessandro Sansonetti |
| 2015 | Protecting caches against multi-bit errors using embedded erasure coding. | Abbas BanaiyanMofrad, Mojtaba Ebrahimi, Fabian Oboril, Mehdi Baradaran Tahoori, Nikil D. Dutt |
| 2015 | Analog test: Why still " la mode" after more than 25 years of research? | Florence Azas |
| 2015 | Microfluidic very large-scale integration for biochips: Technology, testing and fault-tolerant design. | Ismail Emre Araci, Paul Pop, Krishnendu Chakrabarty |
| 2015 | Branch guided functional test generation at the RTL. | Vineeth V. Acharya, Sharad Bagri, Michael S. Hsiao |
| 2014 | Incremental computation of delay fault detection probability for variation-aware test generation. | Marcus Wagner, Hans-Joachim Wunderlich |
| 2014 | Concurrent online BIST for sequential circuits exploiting input reduction and output space compaction. | Ioannis Voyiatzis |
| 2014 | Accumulator-based test-per-clock scheme for low-power on-chip application of test patterns. | Ioannis Voyiatzis |
| 2014 | iBoX - Jitter based Power Supply Noise sensor. | Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot |
| 2014 | Avoiding burnt probe tips: Practical solutions for testing internally regulated power supplies. | Richard Swanson, Anna Wong, Suraj Ethirajan, Amitava Majumdar |
| 2014 | Analysis and mitigation of single event effects on flash-based FPGAS. | Luca Sterpone, Boyang Du |
| 2014 | Error detection and recovery in better-than-worst-case timing designs. | Adit D. Singh |
| 2014 | Systematic generation of diagnostic software-based self-test routines for processor components. | Mario Schlzel, Tobias Koal, Heinrich Theodor Vierhaus |
| 2014 | Smart-hopping: Highly efficient ISA-level fault injection on real hardware. | Horst Schirmeier, Lars Rademacher, Olaf Spinczyk |
| 2014 | Verification of the decimal floating-point square root operation. | Amr A. R. Sayed-Ahmed, Hossam A. H. Fahmy, Ulrich Khne |
| 2014 | Variation-aware deterministic ATPG. | Matthias Sauer, Ilia Polian, Michael E. Imhof, Abdullah Mumtaz, Eric Schneider, Alexander Czutro, Hans-Joachim Wunderlich, Bernd Becker |
| 2014 | Shadow-scan design with low latency overhead and in-situ slack-time monitoring. | Sbastien Sarrazin, Samuel Evain, Ivan Miro Panades, Alexandre Valentian, Suresh Pajaniradja, Lirida Alves de Barros Naviner, Valentin Gherman |