| 2013 | Reconciling the IC test and security dichotomy. | Ozgur Sinanoglu, Naghmeh Karimi, Jeyavijayan Rajendran, Ramesh Karri, Yier Jin, Ke Huang, Yiorgos Makris |
| 2013 | A minimum MSE sensor fusion algorithm with tolerance to multiple faults. | Omid Sarbishei, Atena Roshan Fekr, Majid Janidarmian, Benjamin Nahill, Katarzyna Radecka |
| 2013 | An error-detection and self-repairing method for dynamically and partially reconfigurable systems. | Matteo Sonza Reorda, Luca Sterpone, Anees Ullah |
| 2013 | Experimental evaluation of thread distribution effects on multiple output errors in GPUs. | Paolo Rech, Caroline Aguiar, Christopher Frost, Luigi Carro |
| 2013 | Magical thinking applied to test engineering reality (and vice versa). | Jeff Rearick |
| 2013 | Test generation for circuits with embedded memories using SMT. | Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram |
| 2013 | PinPoint: An algorithm for enhancing diagnostic resolution using capture cycle power information. | Seetal Potluri, Satya Trinadh, Roopashree Baskaran, Nitin Chandrachoodan, V. Kamakoti |
| 2013 | Generation of compact multi-cycle diagnostic test sets. | Irith Pomeranz |
| 2013 | Reducing power dissipation in memory repair for high defect densities. | Panagiota Papavramidou, Michael Nicolaidis |
| 2013 | Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers. | Christos Papameletis, Brion L. Keller, Vivek Chickermane, Erik Jan Marinissen, Said Hamdioui |
| 2013 | Novel approach to reduce power droop during scan-based logic BIST. | Martin Omaa, Daniele Rossi, Filippo Fuzzi, Cecilia Metra, Chandra Tirumurti, R. Galivache |
| 2013 | Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion. | Afsaneh Nassery, Sule Ozev, Mustapha Slamani |
| 2013 | Computing detection probability of delay defects in signal line tsvs. | Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Pascal Vivet, Marc Belleville |
| 2013 | Semiconductor failure modes and mitigation for critical systems embedded tutorial. | Hans A. R. Manhaeve, Esko Mikkola |
| 2013 | Current testing: Dead or alive? | Hans A. R. Manhaeve, Pete Harrod, Adit D. Singh, Chintan Patel, Ralf Arnolc, Davide Appello |
| 2013 | Utilizing circuit structure for scan chain diagnosis. | Wei-Hen Lo, Ang-Chih Hsieh, Chien-Ming Lan, Min-Hsien Lin, TingTing Hwang |
| 2013 | Optimization for timing-speculated circuits by redundancy addition and removal. | Yuxi Liu, Rong Ye, Feng Yuan, Qiang Xu |
| 2013 | A mutual characterization based SAR ADC self-testing technique. | H.-J. Lin, Xuan-Lun Huang, Jiun-Lang Huang |
| 2013 | Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur |
| 2013 | A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing. | Saman Kiamehr, Farshad Firouzi, Mehdi Baradaran Tahoori |
| 2013 | Bias temperature instability analysis in SRAM decoder. | Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor |
| 2013 | RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology. | Christophe Kelma, Sbastien Darfeuille, Andreas Neuburger, Andreas Lobnig |
| 2013 | On combining alternate test with spatial correlation modeling in analog/RF ICs. | Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
| 2013 | Extracting device-parameter variations using a single sensitivity-configurable ring oscillator. | Yuma Higuchi, Kenichi Shinkai, Masanori Hashimoto, Rahul M. Rao, Sani R. Nassif |
| 2013 | Approximate computing: An emerging paradigm for energy-efficient design. | Jie Han, Michael Orshansky |