| 2013 | Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? | Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman |
| 2013 | Efficient fault simulation through dynamic binary translation for dependability analysis of embedded software. | Giuseppe Di Guglielmo, Davide Ferraretto, Franco Fummi, Graziano Pravadelli |
| 2013 | M-S test based on specification validation using octrees in the measure space. | lvaro Gmez-Pau, Luz Balado, Joan Figueras |
| 2013 | Error-correction schemes with erasure information for fast memories. | Samuel Evain, Valentin Gherman |
| 2013 | Outlook for many-core systems: Cloudy with a chance of virtualization. | Nikil D. Dutt |
| 2013 | Run-time detection of hardware Trojans: The processor protection unit. | Jeremy Dubeuf, David Hly, Ramesh Karri |
| 2013 | Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters. | Shyam Kumar Devarakond, Debashis Banerjee, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee |
| 2013 | Robust optimization of test-architecture designs for core-based SoCs. | Sergej Deutsch, Krishnendu Chakrabarty |
| 2013 | Hybrid 3D pre-bonding test framework design. | Unni Chandran, Dan Zhao, Rathish Jayabharathi |
| 2013 | A software-based self test of CUDA Fermi GPUs. | Stefano Di Carlo, Giulio Gambardella, Marco Indaco, Ippazio Martella, Paolo Prinetto, Daniele Rolfo, Pascal Trotta |
| 2013 | Variability-aware and fault-tolerant self-adaptive applications for many-core chips. | Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2013 | Efficient minimization of test frequencies for linear analog circuits. | Mohand Bentobache, Ahcne Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir |
| 2013 | Scan pattern retargeting and merging with reduced access time. | Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2013 | Implementing model redundancy in predictive alternate test to improve test confidence. | Haithem Ayari, Florence Azas, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell |
| 2013 | Efficient selection of signatures for analog/RF alternate test. | Manuel J. Barragan Asian, Gildas Lger |
| 2013 | BIST architecture to detect defects in tsvs during pre-bond testing. | Daniel Arum, Rosa Rodrguez-Montas, Joan Figueras |
| 2012 | Defect analysis in power mode control logic of low-power SRAMs. | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2012 | Diagnostic system based on support-vector machines for board-level functional diagnosis. | Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty |
| 2012 | Adaptive testing: Conquering process variations. | Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell |
| 2012 | Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information. | Ender Yilmaz, Sule Ozev |
| 2012 | Power-aware testing: The next stage. | Xiaoqing Wen |
| 2012 | Test tool qualification through fault injection. | Q. Wang, Andreas Wallin, Viacheslav Izosimov, Urban Ingelsson, Zebo Peng |
| 2012 | Cost and power efficient timing error tolerance in flip-flop based microprocessor cores. | Stefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni |
| 2012 | A Software-Based Self-Test methodology for on-line testing of data TLBs. | George Theodorou, Serafeim Chatzopoulos, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
| 2012 | Adaptive testing of chips with varying distributions of unknown response bits. | Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev |