| 2012 | Online detection and recovery of transient errors in front-end structures of microprocessors. | Syed Zafar Shazli, Mehdi Baradaran Tahoori |
| 2012 | On the quality of test vectors for post-silicon characterization. | Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian |
| 2012 | DfT support for launch and capture power reduction in launch-off-capture testing. | Samah Mohamed Saeed, Ozgur Sinanoglu |
| 2012 | Combining dynamic slicing and mutation operators for ESL correction. | Urmas Repinski, Hanno Hantson, Maksim Jenihhin, Jaan Raik, Raimund Ubar, Giuseppe Di Guglielmo, Graziano Pravadelli, Franco Fummi |
| 2012 | Toggle-masking scheme for x-filtering. | Abishek Ramdas, Ozgur Sinanoglu |
| 2012 | FP7 collaborative research project DIAMOND: Diagnosis, error modeling and correction for reliable systems design. | Jaan Raik |
| 2012 | Fault tolerant FPGA processor based on runtime reconfigurable modules. | Mihalis Psarakis, Andreas Apostolakis |
| 2012 | Functional test generation for hard to detect stuck-at faults using RTL model checking. | Mahesh Prabhu, Jacob A. Abraham |
| 2012 | On the detection of path delay faults by functional broadside tests. | Irith Pomeranz |
| 2012 | Enhanced wafer matching heuristics for 3-D ICs. | Vasilis F. Pavlidis, Hu Xu, Giovanni De Micheli |
| 2012 | Introducing MEDIAN: A new COST Action on manufacturable and dependable multicore architectures at nanoscale. | Marco Ottavi |
| 2012 | Reducing wearout in embedded processors using proactive fine-grain dynamic runtime adaptation. | Fabian Oboril, Mehdi Baradaran Tahoori |
| 2012 | Fast error detection through efficient use of hardwired resources in FPGAs. | Gabriel L. Nazar, Luigi Carro |
| 2012 | Multi-voltage aware resistive open fault modeling. | Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin |
| 2012 | On-chip temperature and voltage measurement for field testing. | Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara |
| 2012 | Through-Silicon-Via resistive-open defect analysis. | Carolina Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel |
| 2012 | The impact of functional safety standards in the design and test of reliable and available integrated circuits. | Riccardo Mariani |
| 2012 | Impact of NBTI on analog components. | Zhengliang Lv, Linda Milor, Shiyuan Yang |
| 2012 | Indirect method for random jitter measurement on SoCs using critical path characterization. | Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham |
| 2012 | Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs. | Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Herv Naudet, Christophe Forel |
| 2012 | A robust metric for screening outliers from analogue product manufacturing tests responses. | Shaji Krishnan, Hans G. Kerkhoff |
| 2012 | Characterization and handling of low-cost micro-architectural signatures in MPSoCs. | Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiss, Andreas Genser, Holger Bock, Josef Haid |
| 2012 | Time-division multiplexing for testing SoCs with DVS and multiple voltage islands. | Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji |
| 2012 | Embedded synthetic instruments for Board-Level testing. | Artur Jutman, Sergei Devadze, Igor Aleksejev, Thomas Wenzel |
| 2012 | Bandwidth-aware test compression logic for SoC designs. | Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski |