IEEE European Test Symposium
ETS
B
CORE rank
CORE rank (raw)
B
Fields of research
Computer Systems Engineering
Papers indexed
1,163
1999–2026
Papers per year
199968 peak2026
Most published authors
ETS papers
1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.
| Year | Title | Authors |
|---|---|---|
| 2012 | On-chip delay measurement circuit. | Abhishek Jain, Andrea Veggetti, Dennis Crippa, Pierluigi Rolandi |
| 2012 | Fault-Tolerant Algebraic Architecture for radiation induced soft-errors. | Fbio P. Itturriet, Ronaldo Rodrigues Ferreira, Luigi Carro |
| 2012 | Disturbance fault testing on various NAND flash memories. | Chih-Sheng Hou, Jin-Fu Li |
| 2012 | Exact stuck-at fault classification in presence of unknowns. | Stefan Hillebrecht, Michael A. Kochte, Hans-Joachim Wunderlich, Bernd Becker |
| 2012 | Dependable embedded systems: The German research foundation DFG priority program SPP 1500. | Jrg Henkel, Oliver Bringmann, Andreas Herkersdorf, Wolfgang Rosenstiel, Norbert Wehn |
| 2012 | Efficient system-level aging prediction. | Nadereh Hatami, Rafal Baranowski, Paolo Prinetto, Hans-Joachim Wunderlich |
| 2012 | Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. | Friedrich Hapke, Jrgen Schlffel |
| 2012 | VLSI Test technology: Why is the field not sexy enough? | Said Hamdioui, Rob Aitken |
| 2012 | Re-using chip level DFT at board level. | Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson |
| 2012 | Memory reliability improvements based on maximized error-correcting codes. | Valentin Gherman, Samuel Evain, Yannick Bonhomme |
| 2012 | Funding project DIANA - Integrated diagnostics for the analysis of electronic failures in vehicles. | Piet Engelke, Hermann Obermeir |
| 2012 | BIST design for analog cell matching. | Cndido Duarte, Henrique Cavadas, Pedro Coke, Luis Malheiro, Vtor Grade Tavares, Pedro Guedes de Oliveira |
| 2012 | Functional analysis of circuits under timing variations. | Mehdi Dehbashi, Grschwin Fey, Kaushik Roy, Anand Raghunathan |
| 2012 | On-chip test comparison for protecting confidential data in secure ICs. | Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
| 2012 | Multi-conditional SAT-ATPG for power-droop testing. | Alexander Czutro, Matthias Sauer, Ilia Polian, Bernd Becker |
| 2012 | Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test. | Alejandro Cook, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2012 | Increasing autonomous fault-tolerant FPGA-based systems' lifetime. | Cristiana Bolchini, Antonio Miele, Chiara Sandionigi |
| 2012 | On-line software-based self-test of the Address Calculation Unit in RISC processors. | Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Snchez, Matteo Sonza Reorda, Oscar Ballan |
| 2012 | Testing of digitally assisted adaptive analog/RF systems using tuning knob - Performance space estimation. | Aritra Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Debashis Banerjee, Abhijit Chatterjee |
| 2012 | Reducing test cost for mixed signal circuits "From TOETS to ELESIS". | Mohamed Azimane |
| 2012 | Coupling-based resistive-open defects in TAS-MRAM architectures. | Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jrmy Alvarez-Herault, Ken Mackay |
| 2012 | OBT for settling error test of sampled-data systems using signal-dependent clocking. | Manuel J. Barragan Asian, Gildas Lger, Jos L. Huertas |
| 2011 | Signature Analysis for Testing, Diagnosis, and Repair of Multi-mode Power Switches. | Zhaobo Zhang, Xrysovalantis Kavousianos, Yan Luo, Yiorgos Tsiatouhas, Krishnendu Chakrabarty |
| 2011 | Fault Masking and Diagnosis in Reversible Circuits. | Masoud Zamani, Navid Farazmand, Mehdi Baradaran Tahoori |
| 2011 | Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor. | Hai Yu, Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh |
726–750 of 1,163← PreviousNext →
Comparable venues
Other A*/A conferences filed under the same field of research.
- ADATEDesign, Automation and Test in Europe Conference
- A*DACDesign Automation Conf
- ASCInternational Conference for High Performance Computing, Networking, Storage and Analysis (was Supercomputing Conference)
- AICCADIEEE/ACM International Conference on Computer-Aided Design
- AITCIEEE International Test Conference
- A*ISCAACM International Symposium on Computer Architecture
- A*MICROInternational Symposium on Microarchitecture
- AISLPEDIEEE/ACM International Symposium on Low Power Electronics and Design