| 2008 | A Reliable Architecture for the Advanced Encryption Standard. | Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre |
| 2008 | Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic. | Cecilia Metra, Daniele Rossi, Martin Omaa, Abhijit Jas, Rajesh Galivanche |
| 2008 | Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. | Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris |
| 2008 | An Improved Algorithm to Identify the Test Stimulus in Histogram-Based A/D Converter Testing. | Esa Korhonen, Juha Kostamovaara |
| 2008 | Bridge Defect Diagnosis for Multiple-Voltage Design. | S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod |
| 2008 | Temporally Extended High-Level Decision Diagrams for PSL Assertions Simulation. | Maksim Jenihhin, Jaan Raik, Anton Chepurov, Raimund Ubar |
| 2008 | Diagnose Multiple Stuck-at Scan Chain Faults. | Yu Huang, Wu-Tung Cheng, Ruifeng Guo |
| 2008 | Adaptive Debug and Diagnosis without Fault Dictionaries. | Stefan Holst, Hans-Joachim Wunderlich |
| 2008 | Accelerated Shift Registers for X-tolerant Test Data Compaction. | Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gssel |
| 2008 | Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories. | Benot Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli |
| 2008 | Convolutional Coding for SEU mitigation. | Laura Frigerio, Matteo Alan Radaelli, Fabio Salice |
| 2008 | Jitter Decomposition in High-Speed Communication Systems. | Qingqi Dou, Jacob A. Abraham |
| 2008 | On Bypassing Blocking Bugs during Post-Silicon Validation. | Ehab Anis Daoud, Nicola Nicolici |
| 2008 | A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. | Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker |
| 2008 | Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism. | Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens |
| 2008 | Self-Programmable Shared BIST for Testing Multiple Memories. | Swapnil Bahl, Vishal Srivastava |
| 2008 | An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso |
| 2008 | Applying March Tests to K-Way Set-Associative Cache Memories. | Simone Alpe, Stefano Di Carlo, Paolo Prinetto, Alessandro Savino |
| 2008 | Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. | Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire |
| 2007 | Parallel Scan-Like Testing and Fault Diagnosis Techniques for Digital Microfluidic Biochips. | Tao Xu, Krishnendu Chakrabarty |
| 2007 | A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. | Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek |
| 2007 | Communication-Centric SoC Debug Using Transactions. | Bart Vermeulen, Kees Goossens, Remco van Steeden, Martijn T. Bennebroek |
| 2007 | Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs. | Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman |
| 2007 | Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. | Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware |
| 2007 | Purely Digital BIST for Any PLL or DLL. | Stephen K. Sunter, Aubin Roy |