| 2007 | Static and Dynamic Analysis of SEU Effects in SRAM-Based FPGAs. | Luca Sterpone, Massimo Violante |
| 2007 | If It's All about Yield, Why Talk about Testing? | Rene Segers |
| 2007 | A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter. | Erik Schler, Marcelo Negreiros, Pascal Nouet, Luigi Carro |
| 2007 | DERRIC: A Tool for Unified Logic Diagnosis. | Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2007 | Test Configurations for Diagnosing Faulty Links in NoC Switches. | Jaan Raik, Raimund Ubar, Vineeth Govind |
| 2007 | Diagnostic Test Generation Based on Subsets of Faults. | Irith Pomeranz, Sudhakar M. Reddy |
| 2007 | An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. | Philipp hler, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2007 | Embedded Tutorial on Low Power Test. | Nicola Nicolici, Xiaoqing Wen |
| 2007 | Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. | Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2007 | Digital Generation of Signals for Low Cost RF BIST. | Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin |
| 2007 | Selecting Power-Optimal SBST Routines for On-Line Processor Testing. | Andreas Merentitis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
| 2007 | Wafer Level Reliability Screens. | Peter C. Maxwell |
| 2007 | Embedded Tutorial: IC Test Cost Benchmarking. | Klaus Luther |
| 2007 | System Level Approaches for Mitigation of Long Duration Transient Faults in Future Technologies. | Carlos Arthur Lang Lisba, Marcelo Ienczczak Erigson, Luigi Carro |
| 2007 | Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives. | Shaji Krishnan, Rene Jonker, Leon van de Logt |
| 2007 | Computation and Application of Absolute Dominators in Industrial Designs. | Rene Krenz-Baath, Andreas Glowatz, Jrgen Schlffel |
| 2007 | FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests. | Ivo Koren, Frank Demmerle, Roland May, Martin Kaibel, Sebastian Sattler |
| 2007 | "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. | Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azas, Mariane Comte, Michel Renovell |
| 2007 | Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. | Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara |
| 2007 | Optimization of NoC Wrapper Design under Bandwidth and Test Time Constraints. | Fawnizu Azmadi Hussin, Tomokazu Yoneda, Hideo Fujiwara |
| 2007 | Adaptive Debug and Diagnosis without Fault Dictionaries. | Stefan Holst, Hans-Joachim Wunderlich |
| 2007 | PPM Reduction on Embedded Memories in System on Chip. | Said Hamdioui, Zaid Al-Ars, Javier Jimnez, Jose Calero |
| 2007 | Automatic Generation of Instructions to Robustly Test Delay Defects in Processors. | Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Daniel G. Saab |
| 2007 | Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. | Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2007 | A Novel Approach for Online Sensor Testing Based on an Encoded Test Stimulus. | Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson |