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IEEE European Test Symposium

ETS

B

CORE rank

CORE rank (raw)

B

Fields of research

Computer Systems Engineering

Papers indexed

1,163

1999–2026

Papers per year

199968 peak2026

ETS papers

1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
1999Compaction of IDDQ test sequence using reassignment method.Toshiyuki Maeda, Kozo Kinoshita
1999A DFT for semi-DC fault diagnosis for switched-capacitor circuits.Sheng-Jer Kuo, Chung Len Lee, Soon-Jyh Chang, Jwu E. Chen
1999Deterministic BIST with partial scan.Gundolf Kiefer, Hans-Joachim Wunderlich
1999A scalable BIST architecture for delay faults.Martin Keim, Ilia Polian, Harry Hengster, Bernd Becker
1999Partial set for flip-flops based on state requirement for non-scan BIST scheme.Marie-Lise Flottes, Christian Landrault, A. Petitqueux
1999On calculating efficient LFSR seeds for built-in self test.Christophe Fagot, Olivier Gascuel, Patrick Girard, Christian Landrault
1999Design of an automatic testing for FPGAs.Abderrahim Doumar, Toshiaki Ohmameuda, Hideo Ito
1999From system level to defect-oriented test: a case study.Octvio Pscoa Dias, Jorge Semio, Marcelino B. Santos, Isabel Maria Cacho Teixeira, Joo Paulo Teixeira
1999A new BIST architecture for low power circuits.Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante
1999On maximizing the coverage of catastrophic and parametric faults.Anna Maria Brosa, Joan Figueras
1999Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier.R. H. Beurze, Y. Xing, R. van Kleef, Ronald J. W. T. Tangelder, Nur Engin
1999A high-level EDA environment for the automatic insertion of HD-BIST structures.Alfredo Benso, Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Yervant Zorian
1999Using the BS register for capturing and storing n-bit sequences in real-time.Gustavo Ribeiro Alves, Jos Manuel Martins Ferreira
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