IEEE European Test Symposium

ETS

CORE rank

CORE rank (raw)

Fields of research

Computer Systems Engineering

Papers indexed

1,163

1999–2026

Best Computer Systems Engineering conferences

Papers per year

199968 peak2026

Most published authors

ETS papers

1,163 records sourced from DBLP. Search titles, filter by year, sort by recency.

Year	Title	Authors
2023	Online Reliability Evaluation Design: Select Reliable CRPs for Arbiter PUF and Its Variants.	Chaofang Ma, Jianan Mu, Jing Ye, Shuai Chen, Yuan Cao, Huawei Li, Xiaowei Li
2023	Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression.	Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee
2023	Counterfeit Detection by Semiconductor Process Technology Inspection.	Matthias Ludwig, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl
2023	Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications.	Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen
2023	A Single-Event Latchup setup for high-precision AMS circuits.	Gildas Lger, Antonio J. Gins, Eduardo J. Peralas, Valentin Gutierrez, Carlos M. Domnguez-Matas, Maria Angeles Jaln, L. Carranza
2023	High Throughput and Energy Efficient SHA-2 ASIC Design for Continuous Integrity Checking Applications.	Asimina Koutra, Vasileios Tenentes
2023	Micro-Architectural features as soft-error markers in embedded safety-critical systems: preliminary study.	Deniz Kasap, Alessio Carpegna, Alessandro Savino, Stefano Di Carlo
2023	A Side-Channel Attack on a Hardware Implementation of CRYSTALS-Kyber.	Yanning Ji, Ruize Wang, Kalle Ngo, Elena Dubrova, Linus Backlund
2023	Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip.	Giorgio Insinga, M. Battilana, Matteo Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, Pierre Scaramuzza, Rudolf Ullmann
2023	Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning	Shao-Chun Hung, Arjun Chaudhuri, Krishnendu Chakrabarty
2023	BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell.	Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu
2023	Understanding Permanent Hardware Failures in Deep Learning Training Accelerator Systems.	Yi He, Yanjing Li
2023	Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips.	Payam Habiby, Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich, Sebastian Huhn, Rolf Drechsler
2023	Dependability of Future Edge-AI Processors: Pandora's Box.	Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Gneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui
2023	High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis.	Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen
2023	SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks.	Gabriele Gavarini, Annachiara Ruospo, Ernesto Snchez
2023	An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds?	Bruno E. Forlin, Wouter van Huffelen, Carlo Cazzaniga, Paolo Rech, Nikolaos Alachiotis, Marco Ottavi
2023	Online Fault Detection and Diagnosis in RRAM.	Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui
2023	Constraint-Based Automatic SBST Generation for RISC-V Processor Families.	Tobias Faller, Nikolaos Ioannis Deligiannis, Markus Schwrer, Matteo Sonza Reorda, Bernd Becker
2023	Learn to Tune: Robust Performance Tuning in Post-Silicon Validation.	Peter Domanski, Dirk Pflger, Raphal Latty
2023	Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing.	Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker, Matteo Sonza Reorda
2023	PSC-Watermark: Power Side Channel Based IP Watermarking Using Clock Gates.	Upoma Das, M. Sazadur Rahman, N. Nalla Anandakumar, Kimia Zamiri Azar, Fahim Rahman, Mark Tehranipoor, Farimah Farahmandi
2023	Physical-aware Interconnect Testing and Repairing of Chiplets.	Changming Cui, Tuanhui Xu, Haitao Fu, Junlin Huang
2023	Evaluating the Prevalence of SFUs in the Reliability of GPUs.	Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patio Nuez, Robert Limas Sierra, Matteo Sonza Reorda
2023	Attacking Memristor-Mapped Graph Neural Network by Inducing Slow-to-Write Errors.	Ching-Yuan Chen, Biresh Kumar Joardar, Janardhan Rao Doppa, Partha Pratim Pande, Krishnendu Chakrabarty

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