| 2007 | Accelerating Soft Error Rate Testing Through Pattern Selection. | Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu |
| 2007 | Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. | Claudia Rusu, Antonin Bougerol, Lorena Anghel, Ccile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrire, Rmi Gaillard |
| 2007 | Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena. | Franz X. Ruckerbauer, Georg Georgakos |
| 2007 | Configurable Error Control Scheme for NoC Signal Integrity. | Daniele Rossi, Paolo Angelini, Cecilia Metra |
| 2007 | A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors. | Marta Portela-Garca, Celia Lpez-Ongil, Mario Garca-Valderas, Luis Entrena |
| 2007 | Self Checking Circuit Optimization by means of Fault Injection Analysis: A Case Study on Reed Solomon Decoders. | Salvatore Pontarelli, Luca Sterpone, Gian Carlo Cardarilli, Marco Re, Matteo Sonza Reorda, Adelio Salsano, Massimo Violante |
| 2007 | Identification of Critical Errors in Imaging Applications. | Ilia Polian, Damian Nowroth, Bernd Becker |
| 2007 | Methodology and Tools Developed for Validation of COTS-based Fault-Tolerant Spacecraft Supercomputers. | Michel Pignol |
| 2007 | Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield. | Somnath Paul, Rajat Subhra Chakraborty, Swarup Bhunia |
| 2007 | Automated Derivation of Application-aware Error Detectors using Static Analysis. | Karthik Pattabiraman, Zbigniew Kalbarczyk, Ravishankar K. Iyer |
| 2007 | Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. | Antonis Papanikolaou, Hua Wang, Miguel Miranda, Francky Catthoor |
| 2007 | Innovative Design Platforms for Reliable SoCs in Advanced Nanometer Technologies. | Davide Pandini |
| 2007 | Applicability of Energy Efficient Coding Methodology to Address Signal Integrity in 3D NoC Fabrics. | Partha Pratim Pande, Amlan Ganguly, Brett Feero, Cristian Grecu |
| 2007 | Probabilistic Concurrent Error Compensation in Nonlinear Digital Filters Using Linearized Checksums. | Muhammad Mudassar Nisar, Maryam Ashouei, Abhijit Chatterjee |
| 2007 | GRAAL: A Fault-Tolerant Architecture for Enabling Nanometric Technologies. | Michael Nicolaidis |
| 2007 | An On-Line Fault Detection Scheme for SBoxes in Secure Circuits. | Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
| 2007 | Fault-Secure Interface Between Fault-Tolerant RAM and Transmission Channel Using Systematic Cyclic Codes. | Fabrice Monteiro, Stanislaw J. Piestrak, Houssein Jaber, Abbas Dandache |
| 2007 | Formal Analysis of Quasi Delay Insensitive Circuits Behavior in the Presence of SEUs. | Yannick Monnet, Marc Renaudin, Rgis Leveugle |
| 2007 | Soft Errors: Technology Trends, System Effects, and Protection Techniques. | Subhasish Mitra, Pia N. Sanda, Norbert Seifert |
| 2007 | Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout. | Subhasish Mitra |
| 2007 | Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test set. | Jimson Mathew, Hafizur Rahaman, Dhiraj K. Pradhan |
| 2007 | A systematic approach for Failure Modes and Effects Analysis of System-On-Chips. | Riccardo Mariani, Gabriele Boschi |
| 2007 | Infant Mortality--The Lesser Known Reliability Issue. | T. M. Mak |
| 2007 | Novel Process and Temperature-Stable BICS for Embedded Analog and Mixed-Signal Test. | John C. Liobe, Martin Margala |
| 2007 | Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC. | Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale |