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On-Line Testing and Robust System Design

IOLTS

C

CORE rank

CORE rank (raw)

C

Fields of research

Computer Systems Engineering · Software Engineering

Papers indexed

1,346

2000–2026

Papers per year

200069 peak2026

IOLTS papers

1,346 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
2004Fault Tolerant Mechatronics.Elmar Dilger, Roland Karrelmeyer, Bernd Straube
2004Sizing CMOS Circuits for Increased Transient Error Tolerance.Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh
2004New High Speed CMOS Self-Checking Voter.Jos Manuel Cazeaux, Daniele Rossi, Cecilia Metra
2004Low-Area On-Chip Circuit for Jitter Measurement in a Phase-Locked Loop.Jos Manuel Cazeaux, Martin Omaa, Cecilia Metra
2004A Signed Digit Adder with Error Correction and Graceful Degradation Capabilities.Gian Carlo Cardarilli, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano
2004Hybrid Soft Error Detection by Means of Infrastructure IP Cores.Letcia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante
2004A New Code with Reduced EMI and Partial EC Possibilities.Eberhard Bhl, Elmar Dilger, M. Bhl
2004Optimization of the Theory of FDD of DES for Alleviation of the State Explosion Problem and Development of CAD Tools for On-line Testing of Digital VLSI Circuits.Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra
2004On the Evaluation of SEU Sensitiveness in SRAM-Based FPGAs.Paolo Bernardi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante
2004A System for Fault Detection and Reconfiguration of Hardware Based Active Networks.Nikolaos G. Bartzoudis, Alexandros G. Fragkiadakis, David J. Parish, Jos Luis Nez
2004Modeling and Simulation of Time Domain Faults in Digital Systems.Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, Joo Paulo Teixeira
2004On Combining Fault Classification and Error Propagation Analysis in RT-Level Dependability Evaluation.Abdelaziz Ammari, K. Hadjiat, Rgis Leveugle
2004A BIST-based Charge Analysis for Embedded Memories.Bartomeu Alorda, Vicent Canals, Ivan de Pal, Jaume Segura
2004A Novel Fault Tolerant Cache to Improve Yield in Nanometer Technologies.Amit Agarwal, Bipul Chandra Paul, Kaushik Roy
2004A Pragmatic Approach to On-Line Testing.V. Agarwal
2003Separate Dual-Transistor Registers - A Circuit Solution for On-line Testing of Transient Error in UDSM-IC.Yi Zhao, Sujit Dey
2003An Improved Markov Source Design for Scan BIST.Chaowen Yu, Wei Li, Sudhakar M. Reddy, Irith Pomeranz
2003Low-Cost, On-Line Software-Based Self-Testing of Embedded Processor Cores.George Xenoulis, Dimitris Gizopoulos, Nektarios Kranitis, Antonis M. Paschalis
2003Analyzing SEU Effects in SRAM-based FPGAs.Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori
2003Analysis of Bit Transition Count for EDAC Encoded FSM.N. Venkateswaran, V. Balaji, Venkataraman Mahalingam, T. L. Rajaprabhu
2003Low-Cost On-Line Fault Detection Using Control Flow Assertions.Rajesh Venkatasubramanian, John P. Hayes, Brian T. Murray
2003A Methodology for Test Replacement Solutions of Obsolete Processors.Raoul Velazco, Lorena Anghel, S. Saleh
2003Increasing Implementability of beta-driven Threshold Checkers.Victor Varshavsky, Ilya Levin, Vladimir Ostrovsky
2003Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy?Fabian Vargas, Diogo B. Brum, Drcio Prestes, Letcia Maria Veiras Bolzani, Eduardo Luis Rhod, Matteo Sonza Reorda
2003A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs.Y. Tsiatouhas, Sotirios Matakias, Angela Arapoyanni, Th. Haniotakis
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