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International Conference on VLSI Design

VLSID

National

CORE rank

CORE rank (raw)

National: India

Fields of research

Distributed Computing and Systems Software

Papers indexed

3,530

1992–2026

Papers per year

1992175 peak2026

VLSID papers

3,530 records sourced from DBLP. Search titles, filter by year, sort by recency.

YearTitleAuthors
1996Parallel simulated annealing strategies for VLSI cell placement.John A. Chandy, Prithviraj Banerjee
1996Mobile Communications: Demands on VLSI Technology, Design and CAD.Anantha P. Chandrakasan, Kurt Keutzer, A. Khandekar, S. L. Maskara, B. D. Pradhan, Mani B. Srivastava
1996Ultra low power digital signal processing.Anantha P. Chandrakasan
1996Design for high-speed testability of stuck-at faults.Tapan J. Chakraborty, Vishwani D. Agrawal
1996An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits.Dhruva R. Chakrabarti, Ajai Jain
1996A low power video encoder with power, memory and bandwidth scalability.Navin Chaddha, Mohan Vishwanath
1996VLSI in Mobile Communication.Robert W. Brodersen, Rajeev Jain
1996Low-Power, Low-Voltage BiCMOS Comparators for Approximately 200MHz, 8bit Operation.Andrea Boni, Carlo Morandi
1996Cubical CAMP for minimization of Boolean functions.Nripendra N. Biswas, C. Srikanth, James Jacob
1996Behavioral Synthesis of Complex Parallel Controllers.Krzysztof Bilinski, Erik L. Dagless, Jonathan M. Saul
1996A micropower analog hearing aid on low voltage CMOS digital process.A. B. Bhattacharyya, Ram Singh Rana, S. K. Guha, Rajendar Bahl, Sneh Anand, M. J. Zarabi, P. A. Govindacharyulu, Vivek Gupta, Vivek Mohan, Jatin Roy, Amul Atri
1996A VLSI architecture for cellular automata based parallel data compression.Subarna Bhattacharjee, J. Bhattacharya, U. Raghavendra, Debashis Saha, Parimal Pal Chaudhuri
1996Synchronous Test Generation Model for Asynchronous Circuits.Savita Banerjee, Srimat T. Chakradhar, Rabindra K. Roy
1996Retiming with logic duplication transformation: theory and an application to partial scan.Arun Balakrishnan, Srimat T. Chakradhar
1996Sequential Circuits with combinational Test Generation Complexity.Arun Balakrishnan, Srimat T. Chakradhar
1996Multi-way partitioning of VLSI circuits.Prathima Agrawal, Balakrishnan Narendran, Narayanan Shivakumar
1996Characteristic polynomial method for verification and test of combinational circuits.Vishwani D. Agrawal, David Lee
1996Science, Technology, and the Indian Society.Vishwani D. Agrawal
1996An Enhanced Macromodel for a CMOS Operational Amplifier for HDL Implementation.Sudhir Aggarwal
1996Practical Test and DFT for Next Generation VLSI.Jacob A. Abraham, Gopi Ganapathy
1996A Novel BIST Architecture With Built-in Self Check.Mohammed Fadle Abdulla, C. P. Ravikumar, Anshul Kumar
1996Testing Analogue Circuits by A C Power Supply Voltage.Abu Khari bin A'Ain, A. H. Bratt, A. P. Dorey
1995A new fuzzy-clustering-based approach for two-way circuit partitioning.Jin-Tai Yan, Pei-Yung Hsiao
1995MUSTC-Testing: Multi-Stage-Combinational Test scheduling at the Register-Transfer Level.Sitaran Yadavalli, Irith Pomeranz, Sudhakar M. Reddy
1995A modular systolic architecture for delayed least mean squares adaptive filtering.V. Visvanathan, S. Ramanathan
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