| 2005 | On-Chip Spectrum Analyzer for Analog Built-In Self Test. | Anup P. Jose, Keith A. Jenkins, Scott K. Reynolds |
| 2005 | Cantilever Type Probe Card for At-Speed Memory Test on Wafer. | Hitoshi Iwai, Atsushi Nakayama, Naoko Itoga, Kotaro Omata |
| 2005 | An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling. | Dongwoo Hong, Cameron Dryden, Gordon Saksena |
| 2005 | Minimal March Tests for Unlinked Static Faults in Random Access Memories. | Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian |
| 2005 | Low-Cost Alternate EVM Test for Wireless Receiver Systems. | Achintya Halder, Abhijit Chatterjee |
| 2005 | Implementing a Scheme for External Deterministic Self-Test. | Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Valentin Gherman, Michael Garbers, Jrgen Schlffel |
| 2005 | Synthesis of Low Power CED Circuits Based on Parity Codes. | Shalini Ghosh, Sugato Basu, Nur A. Touba |
| 2005 | On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. | Norbert Dumas, Florence Azas, Laurent Latorre, Pascal Nouet |
| 2005 | Survey of Design and Process Failure Modes for High-Speed SerDes in Nanometer CMOS. | Cameron Dryden |
| 2005 | Design of Adaptive Nanometer Digital Systems for Effective Control of Soft Error Tolerance. | Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh |
| 2005 | Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan |
| 2005 | Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction. | Rao Desineni, R. D. (Shawn) Blanton |
| 2005 | Towards an Understanding of No Trouble Found Devices. | Scott Davidson |
| 2005 | Jump Scan: A DFT Technique for Low Power Testing. | Min-Hao Chiu, Chien-Mo James Li |
| 2005 | Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS. | Qikai Chen, Hamid Mahmoodi-Meimand, Swarup Bhunia, Kaushik Roy |
| 2005 | Transition Tests for High Performance Microprocessors. | Yi-Shing Chang, Sreejit Chakravarty, Hiep Hoang, Nick Thorpe, Khen Wee |
| 2005 | Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor. | Sreejit Chakravarty, Yi-Shing Chang, Hiep Hoang, Sridhar Jayaraman, Silvio Picano, Cheryl Prunty, Eric W. Savage, Rehan Sheikh, Eric N. Tran, Khen Wee |
| 2005 | A Built-in Self-Test Method for Write-only Content Addressable Memories. | Dilip K. Bhavsar |
| 2005 | Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. | Soumendu Bhattacharya, Abhijit Chatterjee |
| 2005 | Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. | Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press |
| 2005 | Highly Configurable Programmable Built-In Self Test Architecture for High-Speed Memories. | Ismet Bayraktaroglu, Olivier Caty, Yickkei Wong |
| 2005 | A New Algorithm for Dynamic Faults Detection in RAMs. | Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg |
| 2005 | Soft Error Mitigation for SRAM-Based FPGAs. | Ghazanfar Asadi, Mehdi Baradaran Tahoori |
| 2005 | Segmented Addressable Scan Architecture. | Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuck |
| 2005 | Built-In Test of RF Components Using Mapped Feature Extraction Sensors. | Selim Sermet Akbay, Abhijit Chatterjee |