| 1999 | Delay Fault Testing of Designs with Embedded IP Cores. | HyungWon Kim, John P. Hayes |
| 1999 | Modular TSC Checkers for Bose-Lin and Bose Codes. | Xrysovalantis Kavousianos, Dimitris Nikolos |
| 1999 | An Efficient BIST Method for Small Buffers. | Wen-Ben Jone, Der-Cheng Huang, S. C. Wu, Kuen-Jong Lee |
| 1999 | Defect-Oriented Test Scheduling. | Wanli Jiang, Bapiraju Vinnakota |
| 1999 | Scan Vector Compression/Decompression Using Statistical Coding. | Abhijit Jas, Jayabrata Ghosh-Dastidar, Nur A. Touba |
| 1999 | On the Evaluation of Arbitrary Defect Coverage of Test Sets. | Ankur Jain, Michael S. Hsiao, Vamsi Boppana, Masahiro Fujita |
| 1999 | Analyzing the Need for ATPG Targeting GOS Defects. | Eugeni Isern, Miquel Roca, Jaume Segura |
| 1999 | Specification Back-Propagation and Its Application to DC Fault Simulation for Analog/Mixed-Signal Circuits. | Jiun-Lang Huang, Chen-Yang Pan, Kwang-Ting Cheng |
| 1999 | Error Detecting Refreshment for Embedded DRAMs. | Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik |
| 1999 | Behavioral Fault Modeling in a VHDL Synthesis Environment. | Ronald J. Hayne, Barry W. Johnson |
| 1999 | Enhanced Bist-Based Diagnosis of FPGAs via Boundary Scan Access. | Carter Hamilton, Gretchen Gibson, Sajitha Wijesuriya, Charles E. Stroud |
| 1999 | A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits. | Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy |
| 1999 | REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. | Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer |
| 1999 | A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. | Michael Gssel, Andrej A. Morosov, Egor S. Sogomonyan |
| 1999 | A Test Vector Inhibiting Technique for Low Energy BIST Design. | Patrick Girard, Los Guiller, Christian Landrault, Serge Pravossoudovitch |
| 1999 | Adaptive Techniques for Improving Delay Fault Diagnosis. | Jayabrata Ghosh-Dastidar, Nur A. Touba |
| 1999 | Weight-Based Codes and Their Application to Concurrent Error Detection of Multilevel Circuits. | Debaleena Das, Nur A. Touba |
| 1999 | RT-level TPG Exploiting High-Level Synthesis Information. | Silvia Chiusano, Fulvio Corno, Paolo Prinetto |
| 1999 | Test Generation for Ground Bounce in Internal Logic Circuitry. | Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer |
| 1999 | Techniques to Encode and Compress Fault Dictionaries. | Sreejit Chakravarty, Vinodh Gopal |
| 1999 | Built-in Test Pattern Generation For High-Performance Cir cuits Using Twisted-Ring Counters. | Krishnendu Chakrabarty, Brian T. Murray, Vikram Iyengar |
| 1999 | Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. | Th. Calin, Lorena Anghel, Michael Nicolaidis |
| 1999 | Instruction-Driven Wake-Up Mechanisms for Snoopy TAP Controller. | Debashis Bhattacharya |
| 1999 | Low-Cost On-Line Test for Digital Filters. | Ismet Bayraktaroglu, Alex Orailoglu |
| 1999 | Instruction Randomization Self Test For Processor Cores. | Ken Batcher, Christos A. Papachristou |