| 1997 | BIST TPGs for Faults in Board Level Interconnect via Boundary Scan. | Chen-Huan Chiang, Sandeep K. Gupta |
| 1997 | ATE for VLSI: What Challenges Lie Ahead? | D. Cheung, Bernd Koenemann, S. Nishtala, B. West, D. Wu |
| 1997 | On the Fault Coverage of Interconnect Diagnosis. | Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi |
| 1997 | High Quality Robust Tests for Path Delay Faults. | Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer |
| 1997 | SHOrt voltage elevation (SHOVE) test for weak CMOS ICs. | Jonathan T.-Y. Chang, Edward J. McCluskey |
| 1997 | Functional test pattern generation for CMOS operational amplifier. | Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen |
| 1997 | Analysis of Ground Bounce in Deep Sub-Micron Circuits. | Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer |
| 1997 | A high-level synthesis approach to design of fault-tolerant systems. | Giacomo Buonanno, M. Pugassi, Mariagiovanna Sami |
| 1997 | Will 0.1um Digital Circuits Require Mixed-Signal Testing. | Melvin A. Breuer, Bozena Kaminska, John E. McDermid, V. Rayapathi, Donald L. Wheater |
| 1997 | Systems On Silicon: Design and Test Challenges. | J. Borel, M. Cecchini, C. Malipeddi, Janusz Rajski, Yervant Zorian |
| 1997 | Determination of coherence errors in ADC spectral domain testing. | W. D. Bartlett |
| 1997 | Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. | Karim Arabi, Bozena Kaminska |
| 1997 | Differential Sensing Strategy for Dynamic Thermal Testing of ICs. | Josep Altet, Antonio Rubio |
| 1997 | An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken |
| 1997 | Power Dissipation During Testing: Should We Worry About it? | Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian |
| 1997 | Hardware Test: Can We Learn from Software Testing? | J. Abraham, Phyllis G. Frankl, Christian Landrault, Meryem Marzouki, Paolo Prinetto, Chantal Robach, Pascale Thvenod-Fosse |
| 1997 | CLP-based Multifrequency Test Generation for Analog Circuits. | Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska |
| 1997 | Microprocessor Test and Validation: Any New Avenues? | Magdy S. Abadir, Jacob A. Abraham, Hong Hao, C. Hunter, Wayne M. Needham, Ron G. Walther |
| 1996 | A novel test generation approach for parametric faults in linear analog circuits . | Hong Helena Zheng, Ashok Balivada, Jacob A. Abraham |
| 1996 | Testing "untestable" faults in three-state circuits. | Peter Wohl, John A. Waicukauski, Matthew Graf |
| 1996 | Standard and ROM-based synthesis of FSMs with control flow checking capabilities. | X. Wendling, Raphal Rochet, Rgis Leveugle |
| 1996 | Initialization of sequential circuits and its application to ATPG. | Jalal A. Wehbeh, Daniel G. Saab |
| 1996 | Monitoring power dissipation for fault detection. | Bapiraju Vinnakota |
| 1996 | Testing trees for multiple faults. | Anastasios Vergis, Carlos Tobon |
| 1996 | Dynamic diagnosis of sequential circuits based on stuck-at faults. | Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs |