Skip to content

Janak H. Patel

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

123

Venues

16

Active years

1976–2005

Best venue rank

A*

Where they publish

Papers

123 indexed papers, newest first.

YearVenueTitleAuthors
2005ICCDHardware Ef.cient LBISTWith Complementary Weights.Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
2004ITCLogic BIST with Scan Chain Segmentation.Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
2004VTSLogic BIST Using Constrained Scan Cells.Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel
2004VTSWhat Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?Manish Sharma, Janak H. Patel
2003VTSApplication of Saluja-Karpovsky Compactors to Test Responses with Many Unknowns.Janak H. Patel, Steven S. Lumetta, Sudhakar M. Reddy
2003VTSTest Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture.Manish Sharma, Janak H. Patel, Jeff Rearick
2002DATEAn Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs.Amit R. Pandey, Janak H. Patel
2002ITCFinding a Small Set of Longest Testable Paths that Cover Every Gate.Manish Sharma, Janak H. Patel
2002VTSReconfiguration Technique for Reducing Test Time and Test Data Volume in Illinois Scan Architecture Based Designs .Amit R. Pandey, Janak H. Patel
2001ITCA case study on the implementation of the Illinois Scan Architecture.Frank F. Hsu, Kenneth M. Butler, Janak H. Patel
2001ITCTesting of critical paths for delay faults.Manish Sharma, Janak H. Patel
2001VLSIDA Graph Traversal Based Framework For Sequential Logic Implication With An Application To C-Cycle Redundancy Identification.Jian-Kun Zhao, Jeffrey A. Newquist, Janak H. Patel
2000ICCADDeterministic Test Pattern Generation Techniques for Sequential Circuits.Ilker Hamzaoglu, Janak H. Patel
2000ITCEnhanced delay defect coverage with path-segments.Manish Sharma, Janak H. Patel
2000VTSReducing Test Application Time for Built-in-Self-Test Test Pattern Generators.Ilker Hamzaoglu, Janak H. Patel
2000VTSBounding Circuit Delay by Testing a Very Small Subset of Paths.Manish Sharma, Janak H. Patel
1999VLSIDA Test Generator for Segment Delay Faults.Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
1999VLSIDAn Approach to Evaluating the Effects of Realistic Faults in Digital Circuits.Zbigniew Kalbarczyk, Janak H. Patel, Myeong S. Lee, Ravishankar K. Iyer
1998ICCADTest set compaction algorithms for combinational circuits.Ilker Hamzaoglu, Janak H. Patel
1998ICCADHigh-level variable selection for partial-scan implementation.Frank F. Hsu, Janak H. Patel
1998ICCDEnhancing topological ATPG with high-level information and symbolic techniques.Fulvio Corno, Janak H. Patel, Elizabeth M. Rudnick, Matteo Sonza Reorda, Roberto Vietti
1998ISCAA Low-Overhead Coherence Solution for Multiprocessors with Private Cache Memories.Mark S. Papamarcos, Janak H. Patel
1998ISCARetrospective: Improving the Throughput of a Pipeline by Insertion of Delays.Janak H. Patel
1998ISCARetrospective: A Low-Overhead Coherence Solution for Multiprocessors with Private Cache Memories.Janak H. Patel
1998ISCAImproving the Throughput of a Pipeline by Insertion of Delays.Janak H. Patel, Edward S. Davidson
1998ITCStuck-at fault: a fault model for the next millennium.Janak H. Patel
1998ITCCompact two-pattern test set generation for combinational and full scan circuits.Ilker Hamzaoglu, Janak H. Patel
1998VLSIDPartial Scan Selection Based on Dynamic Reachability and Observability Information.Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel
1998VLSIDDiagnostic Simulation of Sequential Circuits Using Fault Sampling.Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel
1998VTSNew Techniques for Deterministic Test Pattern Generation.Ilker Hamzaoglu, Janak H. Patel
1997DATESequential circuit test generation using dynamic state traversal.Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
1997ICCADFast identification of untestable delay faults using implications.Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
1997ICCADEffects of delay models on peak power estimation of VLSI sequential circuits.Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
1997ISLPEDK2: an estimator for peak sustainable power of VLSI circuits.Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
1997ITCBART: A Bridging Fault Test Generation for Sequential Circuits.James P. Cusey, Janak H. Patel
1997ITCPutting the Squeeze on Test Sequences.Elizabeth M. Rudnick, Janak H. Patel
1997PADSAsynchronous Parallel Algorithms for Test Set Partitioned Fault Simulation.Dilip Krishnaswamy, Prithviraj Banerjee, Elizabeth M. Rudnick, Janak H. Patel
1997VLSIDDynamic Fault Grouping for PROOFS: A Win for Large Sequential Circuits.Charles R. Graham, Elizabeth M. Rudnick, Janak H. Patel
1997VLSIDParallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation.Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxena, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee
1997VLSIDOvercoming the Serial Logic Simulation Bottleneck in Parallel Fault Simulation.Elizabeth M. Rudnick, Janak H. Patel
1997VTSDiagnostic Test Pattern Generation for Sequential Circuits.Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs
1997VTSFast Algorithms for Static Compaction of Sequential Circuit Test Vectors.Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
1997VTSSPITFIRE: scalable parallel algorithms for test set partitioned fault simulation.Dilip Krishnaswamy, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee
1997VTSStatic logic implication with application to redundancy identification.Jian-Kun Zhao, Elizabeth M. Rudnick, Janak H. Patel
1996DACPartial Scan Design Based on Circuit State Information.Dong Xiang, Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel
1996DATEAlternating Strategies for Sequential Circuit ATPG.Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
1996ICCADSIGMA: a simulator for segment delay faults.Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
1996ICCADEnhancing high-level control-flow for improved testability.Frank F. Hsu, Elizabeth M. Rudnick, Janak H. Patel
1996ICCADSimulation-based techniques for dynamic test sequence compaction.Elizabeth M. Rudnick, Janak H. Patel
1996ITCOn Potential Fault Detection in Sequential Circuits.Elizabeth M. Rudnick, Janak H. Patel, Irith Pomeranz
1996ITCA Global Algorithm for the Partial Scan Design Problem Using Circuit State Information.Dong Xiang, Janak H. Patel
1996VLSIDImproving accuracy in path delay fault coverage estimation.Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
1996VTSSegment delay faults: a new fault model.Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal
1996VTSAutomatic test generation using genetically-engineered distinguishing sequences.Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
1996VTSGenetic-algorithm-based test generation for current testing of bridging faults in CMOS VLSI circuits.Terry Lee, Ibrahim N. Hajj, Elizabeth M. Rudnick, Janak H. Patel
1995DACCombining Deterministic and Genetic Approaches for Sequential Circuit Test Generation.Elizabeth M. Rudnick, Janak H. Patel
1995DACRapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists.Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel
1995ICCDA new architectural-level fault simulation using propagation prediction of grouped fault-effects.Michael S. Hsiao, Janak H. Patel
1995ICCDA parallel algorithm for fault simulation based on PROOFS .Steven Parkes, Prithviraj Banerjee, Janak H. Patel
1995VLSIDA genetic approach to test application time reduction for full scan and partial scan circuits.Elizabeth M. Rudnick, Janak H. Patel
1995VTSCyclic stress tests for full scan circuits.Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel
1995VTSA distance reduction approach to design for testability.Frank F. Hsu, Janak H. Patel
1994DACMicroprocessor Testing: Which Technique is Best? (Panel).Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther
1994DACProperHITEC: A Portable, Parallel, Object-Oriented Approach to Sequential Test Generation.Steven Parkes, Prithviraj Banerjee, Janak H. Patel
1994DACSequential Circuit Test Generation in a Genetic Algorithm Framework.Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann
1994ICCADFast timing simulation of transient faults in digital circuits.Abhijit Dharchoudhury, Sung-Mo Kang, Hungse Cha, Janak H. Patel
1994ICCDLatch Design for Transient Pulse Tolerance.Hungse Cha, Janak H. Patel
1993DACNon-Scan Design-for-Testability Techniques for Sequential Circuits.Vivek Chickermane, Elizabeth M. Rudnick, Prithviraj Banerjee, Janak H. Patel
1993ICCDA Logic-Level Model for alpha-Paricle Hits in CMOS Circuits.Hungse Cha, Janak H. Patel
1993ICPPMemory Reference Behavior of Compiler Optimized Programs on High Speed.John W. C. Fu, Janak H. Patel
1993ISCASEfficient Variable Ordering Heuristics for Shared ROBDD.Pi-Yu Chung, Ibrahim N. Hajj, Janak H. Patel
1993ITCFast and Accurate CMOS Bridging Fault Simulation.Jeff Rearick, Janak H. Patel
1993VTSImpact of high level functional constraints on testability.Jaushin Lee, Vivek Chickermane, Janak H. Patel
1993VTSTestability analysis based on structural and behavioral information.Jaushin Lee, Janak H. Patel
1992DACAPT: An Area-Performance-Testability Driven Placement Algorithm.Sungho Kim, Prithviraj Banerjee, Vivek Chickermane, Janak H. Patel
1992DACHierarchical Test Generation under Intensive Global Functional Constraints.Jaushin Lee, Janak H. Patel
1992ICCADA comparative study of design for testability methods using high-level and gate-level descriptions.Vivek Chickermane, Jaushin Lee, Janak H. Patel
1992ICCADE-PROOFS: a CMOS bridging fault simulator.Gary S. Greenstein, Janak H. Patel
1992ICCADAutomatic test generation for linear digital systems with bi-level search using matrix transform methods.Rabindra K. Roy, Abhijit Chatterjee, Janak H. Patel, Jacob A. Abraham, Manuel A. d'Abreu
1992ICPPCompile Time Parallel Resource Allocation for Unbounded Tree Structure Task Graphs.Jeff Baxter, Balkrishna Ramkumar, Janak H. Patel
1992ITCDesign for Testability Using Architectural Descriptions.Vivek Chickermane, Jaushin Lee, Janak H. Patel
1992ITCAn Instruction Sequence Assembling Methodology for Testing Microprocessors.Jaushin Lee, Janak H. Patel
1992ITCDiagnostic Fault Simulation of Sequential Circuits.Elizabeth M. Rudnick, W. Kent Fuchs, Janak H. Patel
1992MICROStride directed prefetching in scalar processors.John W. C. Fu, Janak H. Patel, Bob L. Janssens
1992VTSProbe point insertion for at-speed test.Elizabeth M. Rudnick, Vivek Chickermane, Janak H. Patel
1991DACParallel Test Generation for Sequential Circuits on General-Purpose Multiprocessors.Srinivas Patil, Prithviraj Banerjee, Janak H. Patel
1991ICCADA Fault Oriented Partial Scan Design Approach.Vivek Chickermane, Janak H. Patel
1991ICCADA Signal-Driven Discrete Relaxation Technique for Architectural Level Test Generation.Jaushin Lee, Janak H. Patel
1991ICCADMethods for Reducing Events in Sequential Circuit Fault Simulation.Elizabeth M. Rudnick, Thomas M. Niermann, Janak H. Patel
1991ISCAData Prefetching in Multiprocessor Vector Cache Memories.John W. C. Fu, Janak H. Patel
1991ITCARTEST: An Architectural Level Test Generator for Data Path Faults and Control Faults.Jaushin Lee, Janak H. Patel
1990DACProofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator.Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel
1990ICPPPerformance Evaluation of Clusters of NETRA: An Architecture for Computer Vision Systems.Alok N. Choudhary, Janak H. Patel
1990ICPRA reconfigurable and hierarchical parallel processing architecture: performance results for stereo vision.Alok N. Choudhary, Subhodev Das, Narendra Ahuja, Janak H. Patel
1990ICPRParallel implementation and evaluation of motion estimation system algorithms on a distributed memory multiprocessor using knowledge based mappings.Alok N. Choudhary, Mun K. Leung, Thomas S. Huang, Janak H. Patel
1990ITCAn optimization based approach to the partial scan design problem.Vivek Chickermane, Janak H. Patel
1989DACA Functional-Level Test Generation Methodology Using Two-level Representations.Utpal J. Dav, Janak H. Patel
1989ICCADAccurate logic simulation in the presence of unknowns.Susheel J. Chandra, Janak H. Patel
1989ICPPThe LAST Algorithm: A Heuristic-Based Static Task Allocation Algorithm.Jeff Baxter, Janak H. Patel
1989ICPPCache-Based Error Recovery for Shared Memory Multiprocessor Systems.Kun-Lung Wu, W. Kent Fuchs, Janak H. Patel
1989SCLoad balancing and task decomposition techniques for parallel implementation of integrated vision systems algorithms.Alok N. Choudhary, Janak H. Patel
1988ICCADDiagnosis and repair of memory with coupling faults.Ming-Feng Chang, W. Kent Fuchs, Janak H. Patel
1988ICCADCompaction of ATPG-generated test sequences for sequential circuits.Rabindra K. Roy, Thomas M. Niermann, Janak H. Patel, Jacob A. Abraham, Resve A. Saleh
1988ICCDTest generation in a parallel processing environment.Susheel J. Chandra, Janak H. Patel
1988ICPPA Parallel Processing Architecture for an Integrated Vision System.Alok N. Choudhary, Janak H. Patel
1988ISCAPerformance Evaluation of On-Chip Register and Cache Organizations.Richard J. Eickemeyer, Janak H. Patel
1987DACA Hierarchical Approach Test Vector Generation.Susheel J. Chandra, Janak H. Patel
1987DACDesign and Algorithms for Parallel Testing of Random Access and Content Addressable Memories.Pinaki Mazumder, Janak H. Patel, W. Kent Fuchs
1987ICPPParallel Garbage Collection on a Virtual Memory System.Santosh G. Abraham, Janak H. Patel
1987ISCAPerformance Evaluation of Multiple Register Sets.Richard J. Eickemeyer, Janak H. Patel
1986DACEffectiveness of heuristics measures for automatic test pattern generation.Sanjay J. Patel, Janak H. Patel
1986ISCAPerformance Measurement of Paging Behavior in Multiprogramming Systems.Mohammad Malkawi, Janak H. Patel
1985ISCAParallel Garbage Collection Without Synchronization Overhead.Ashwin Ram, Janak H. Patel
1985ISCAAn Efficient LISP-Execution Architecture with a New Representation for List Structures.Gurindar S. Sohi, Edward S. Davidson, Janak H. Patel
1985ITCMultiple-Fault Detection in Iterative Logic Arrays.Wu-Tung Cheng, Janak H. Patel
1985SOSPCompiler Directed Memory Management Policy For Numerical Programs.Mohammad Malkawi, Janak H. Patel
1984ISCAA Low-Overhead Coherence Solution for Multiprocessors with Private Cache Memories.Mark S. Papamarcos, Janak H. Patel
1984ITCDesign of Test Pattern Generators for Built-In Test.Ramaswami Dandapani, Janak H. Patel, Jacob A. Abraham
1983ISCAPerformance of Shared Cache for Parallel-Pipelined Computer SystemsPhil C. C. Yeh, Janak H. Patel, Edward S. Davidson
1982ICPPA performance model for instruction prefetch in pipelined instruction units.Gregory F. Grohoski, Janak H. Patel
1979ISCAProcessor-Memory Interconnections for Multiprocessors.Janak H. Patel
1978ISCAPipelines wth Internal Buffers.Janak H. Patel
1976ISCAImproving the Throughput of a Pipeline by Insertion of Delays.Janak H. Patel, Edward S. Davidson