| 2010 | Plenary presentations: Keynote: The product complexity and test - How product complexity impacts test industry. | Michael Campbell |
| 2010 | Algorithm-based fault tolerance for many-core architectures. | Claus Braun, Hans-Joachim Wunderlich |
| 2010 | Evaluation of concurrent error detection techniques on the Advanced Encryption Standard. | Kaouthar Bousselam, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
| 2010 | Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. | Gabriel de M. Borges, Luiz Fernando Gonalves, Tiago R. Balen, Marcelo Lubaszewski |
| 2010 | An integrated flow for the design of hardened circuits on SRAM-based FPGAs. | Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Niccol Battezzati, Luca Sterpone, Massimo Violante |
| 2010 | An adaptive tester architecture for volume diagnosis. | Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda |
| 2010 | Diagnosis of failing scan cells through orthogonal response compaction. | Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer |
| 2010 | Low-cost signature test of RF blocks based on envelope response analysis. | Manuel J. Barragan Asian, Rafaella Fiorelli, Diego Vzquez, Adoracin Rueda, Jos Luis Huertas |
| 2010 | Test power reduction in compression-based reconfigurable scan architectures. | Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah |
| 2010 | Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints. | Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu |
| 2010 | Add-on blocks and algorithms for improving stimulus compression. | Nader Alawadhi, Ozgur Sinanoglu, Mohammed Al-Mulla |
| 2010 | Modified T-Flip-Flop based scan cell for RAS. | Raghavendra Adiga, Gandhi Arpit, Virendra Singh, Kewal K. Saluja, Adit D. Singh |
| 2010 | Sensors for built-in alternate RF test. | Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir |
| 2009 | On Minimization of Peak Power for Scan Circuit during Test. | Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Vishwani D. Agrawal |
| 2009 | Critical Path Selection for Delay Test Considering Coupling Noise. | Rajeshwary Tayade, Jacob A. Abraham |
| 2009 | Defect Filter for Alternate RF Test. | Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev |
| 2009 | A Two Phase Approach for Minimal Diagnostic Test Set Generation. | Mohammed Ashfaq Shukoor, Vishwani D. Agrawal |
| 2009 | Algorithms for ADC Multi-site Test with Digital Input Stimulus. | Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud |
| 2009 | Categorizing and Analysis of Activated Faults in the FlexRay Communication Controller Registers. | Yasser Sedaghat, Seyed Ghassem Miremadi |
| 2009 | A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. | Josep Rius, Luis Elvira Villagra, Maurice Meijer |
| 2009 | We Have Got Compression, What Next? | Janusz Rajski |
| 2009 | Masking of X-values by Use of a Hierarchically Configurable Register. | Thomas Rabenalt, Michael Gssel, Andreas Leininger |
| 2009 | Input Cubes with Lingering Synchronization Effects and their Use in Random Sequential Test Generation. | Irith Pomeranz, Sudhakar M. Reddy |
| 2009 | Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. | Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner |
| 2009 | Something I Always Wanted to Know About Test, But Was Afraid to Ask. | Christian Landrault |