| 2015 | Mining simulation metrics for failure triage in regression testing. | Zissis Poulos, Andreas G. Veneris |
| 2015 | Low-power memory repair for high defect densities. | Panagiota Papavramidou, Michael Nicolaidis |
| 2015 | Timing-resilient Network-on-Chip architectures. | Alexandros Panteloukas, Anastasios Psarras, Chrysostomos Nicopoulos, Giorgos Dimitrakopoulos |
| 2015 | Power analysis attacks on ARX: An application to Salsa20. | Bodhisatwa Mazumdar, Sk Subidh Ali, Ozgur Sinanoglu |
| 2015 | Simplification of fully delay testable combinational circuits. | Anzhela Yu. Matrosova, Eugeniy Mitrofanov, Toral Shah |
| 2015 | Efficient observation point selection for aging monitoring. | Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich |
| 2015 | Towards Trojan circuit detection with maximum state transition exploration. | Joseph Lenox, Spyros Tragoudas |
| 2015 | Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses. | Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener |
| 2015 | A single chip dependable and adaptable payload Data Processing Unit. | Nektarios Kranitis, Antonis Tsigkanos, George Theodorou, Ioannis Sideris, Antonis M. Paschalis |
| 2015 | An accurate soft error propagation analysis technique considering temporal masking disablement. | Yuta Kimi, Go Matsukawa, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto |
| 2015 | Soft error immune latch under SEU related double-node charge collection. | Katerina Katsarou, Yiorgos Tsiatouhas |
| 2015 | Filtering-based error-tolerability evaluation of image processing circuits. | Tong-Yu Hsieh, Yi-Han Peng |
| 2015 | An effective embedded test & diagnosis solution for external memories. | Gurgen Harutunyan, Yervant Zorian |
| 2015 | Efficient multilevel formal analysis and estimation of design vulnerability to Single Event Transients. | Ghaith Bany Hamad, Otmane At Mohamed, Yvon Savaria |
| 2015 | Reliability/yield trade-off in mitigating "no trouble found" field returns. | Amr Haggag, Nik Sumikawa, Aamer Shaukat |
| 2015 | Fault modeling and testing of through silicon via interconnections. | Vasileios Gerakis, Leonidas Katselas, Alkis A. Hatzopoulos |
| 2015 | Flip-flop SEU reduction through minimization of the temporal vulnerability factor (TVF). | Adrian Evans, Enrico Costenaro, Arkady Bramnik |
| 2015 | Characterizing fault propagation in safety-critical processor designs. | Jaime Espinosa, Carles Hernndez, Jaume Abella |
| 2015 | Low leakage radiation tolerant CAM/TCAM cell. | Nikolaos Eftaxiopoulos-Sarris, Nicholas Axelos, Kiamal Z. Pekmestzi |
| 2015 | MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip. | Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis |
| 2015 | Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. | Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos |
| 2015 | On the maximization of the sustained switching activity in a processor. | Riccardo Cantoro, Matteo Sonza Reorda, Alireza Rohani, Hans G. Kerkhoff |
| 2015 | New byte error correcting codes with simple decoding for reliable cache design. | Lake Bu, Mark G. Karpovsky, Zhen Wang |
| 2015 | Concurrent error detection in nonlinear digital filters using checksum linearization and residue prediction. | Suvadeep Banerjee, Md Imran Momtaz, Abhijit Chatterjee |
| 2015 | An Hybrid Architecture for consolidating mixed criticality applications on multicore systems. | Serhiy Avramenko, Stefano Esposito, Massimo Violante, Marco Sozzi, Massimo Traversone, Marco Binello, Marco Terrone |